Intrinsic beam emittance of laser-accelerated electrons measured by x-ray spectroscopic imaging

G. Golovin, S. Banerjee, C. Liu, S. Chen, J. Zhang, B. Zhao, P. Zhang, M. Veale, M. Wilson, P. Seller, D. Umstadter

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

The recent combination of ultra-intense lasers and laser-accelerated electron beams is enabling the development of a new generation of compact x-ray light sources, the coherence of which depends directly on electron beam emittance. Although the emittance of accelerated electron beams can be low, it can grow due to the effects of space charge during free-space propagation. Direct experimental measurement of this important property is complicated by micron-scale beam sizes, and the presence of intense fields at the location where space charge acts. Reported here is a novel, non-destructive, single-shot method that overcame this problem. It employed an intense laser probe pulse, and spectroscopic imaging of the inverse-Compton scattered x-rays, allowing measurement of an ultra-low value for the normalized transverse emittance, 0.15 (±0.06) πmm mrad, as well as study of its subsequent growth upon exiting the accelerator. The technique and results are critical for designing multi-stage laser-wakefield accelerators, and generating high-brightness, spatially coherent x-rays.

Original languageEnglish (US)
Article number24622
JournalScientific reports
Volume6
DOIs
StatePublished - Apr 19 2016

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emittance
electron beams
lasers
space charge
accelerators
electrons
x rays
shot
light sources
brightness
propagation
probes
pulses

ASJC Scopus subject areas

  • General

Cite this

Intrinsic beam emittance of laser-accelerated electrons measured by x-ray spectroscopic imaging. / Golovin, G.; Banerjee, S.; Liu, C.; Chen, S.; Zhang, J.; Zhao, B.; Zhang, P.; Veale, M.; Wilson, M.; Seller, P.; Umstadter, D.

In: Scientific reports, Vol. 6, 24622, 19.04.2016.

Research output: Contribution to journalArticle

Golovin, G, Banerjee, S, Liu, C, Chen, S, Zhang, J, Zhao, B, Zhang, P, Veale, M, Wilson, M, Seller, P & Umstadter, D 2016, 'Intrinsic beam emittance of laser-accelerated electrons measured by x-ray spectroscopic imaging', Scientific reports, vol. 6, 24622. https://doi.org/10.1038/srep24622
Golovin, G. ; Banerjee, S. ; Liu, C. ; Chen, S. ; Zhang, J. ; Zhao, B. ; Zhang, P. ; Veale, M. ; Wilson, M. ; Seller, P. ; Umstadter, D. / Intrinsic beam emittance of laser-accelerated electrons measured by x-ray spectroscopic imaging. In: Scientific reports. 2016 ; Vol. 6.
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AU - Zhao, B.

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AU - Veale, M.

AU - Wilson, M.

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