Internal fields of a spherical particle illuminated by a tightly focused laser beam: Focal point positioning effects at resonance

J. P. Barton, D. R. Alexander, S. A. Schaub

Research output: Contribution to journalArticle

79 Citations (Scopus)

Abstract

The spherical particle/arbitrary beam interaction theory developed in an earlier paper is used to investigate the dependence of structural resonance behavior on focal point positioning for a spherical particle illuminated by a tightly focused (beam diameter less than sphere diameter), linearly polarized, Gaussian-profiled laser beam. Calculations of absorption efficiency and distributions of normalized source function (electric field magnitude) are presented as a function of focal point positioning for a particle with a complex relative index of refraction of n̄=1.33+5.0×10- 6i and a size parameter of α≊29.5 at both nonresonance and resonance conditions. The results of the calculations indicate that structural resonances are not excited during the on-center focal point positioning of such a tightly focused beam but structural resonances can be excited by proper on-edge focal point positioning. Electric wave resonances were found to be excited by moving the focal point from on-center towards the edge of the sphere parallel to the direction of the incident beam electric field polarization. Magnetic wave resonances were found to be excited by moving the focal point from on-center towards the edge of the sphere perpendicular to the direction of the incident beam electric field polarization.

Original languageEnglish (US)
Pages (from-to)2900-2906
Number of pages7
JournalJournal of Applied Physics
Volume65
Issue number8
DOIs
StatePublished - Dec 1 1989

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positioning
laser beams
electric fields
beams (supports)
nonresonance
beam interactions
particle beams
polarization
refraction

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Internal fields of a spherical particle illuminated by a tightly focused laser beam : Focal point positioning effects at resonance. / Barton, J. P.; Alexander, D. R.; Schaub, S. A.

In: Journal of Applied Physics, Vol. 65, No. 8, 01.12.1989, p. 2900-2906.

Research output: Contribution to journalArticle

@article{69921e2a683c44e2821505055ff836c0,
title = "Internal fields of a spherical particle illuminated by a tightly focused laser beam: Focal point positioning effects at resonance",
abstract = "The spherical particle/arbitrary beam interaction theory developed in an earlier paper is used to investigate the dependence of structural resonance behavior on focal point positioning for a spherical particle illuminated by a tightly focused (beam diameter less than sphere diameter), linearly polarized, Gaussian-profiled laser beam. Calculations of absorption efficiency and distributions of normalized source function (electric field magnitude) are presented as a function of focal point positioning for a particle with a complex relative index of refraction of n̄=1.33+5.0×10- 6i and a size parameter of α≊29.5 at both nonresonance and resonance conditions. The results of the calculations indicate that structural resonances are not excited during the on-center focal point positioning of such a tightly focused beam but structural resonances can be excited by proper on-edge focal point positioning. Electric wave resonances were found to be excited by moving the focal point from on-center towards the edge of the sphere parallel to the direction of the incident beam electric field polarization. Magnetic wave resonances were found to be excited by moving the focal point from on-center towards the edge of the sphere perpendicular to the direction of the incident beam electric field polarization.",
author = "Barton, {J. P.} and Alexander, {D. R.} and Schaub, {S. A.}",
year = "1989",
month = "12",
day = "1",
doi = "10.1063/1.342736",
language = "English (US)",
volume = "65",
pages = "2900--2906",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "8",

}

TY - JOUR

T1 - Internal fields of a spherical particle illuminated by a tightly focused laser beam

T2 - Focal point positioning effects at resonance

AU - Barton, J. P.

AU - Alexander, D. R.

AU - Schaub, S. A.

PY - 1989/12/1

Y1 - 1989/12/1

N2 - The spherical particle/arbitrary beam interaction theory developed in an earlier paper is used to investigate the dependence of structural resonance behavior on focal point positioning for a spherical particle illuminated by a tightly focused (beam diameter less than sphere diameter), linearly polarized, Gaussian-profiled laser beam. Calculations of absorption efficiency and distributions of normalized source function (electric field magnitude) are presented as a function of focal point positioning for a particle with a complex relative index of refraction of n̄=1.33+5.0×10- 6i and a size parameter of α≊29.5 at both nonresonance and resonance conditions. The results of the calculations indicate that structural resonances are not excited during the on-center focal point positioning of such a tightly focused beam but structural resonances can be excited by proper on-edge focal point positioning. Electric wave resonances were found to be excited by moving the focal point from on-center towards the edge of the sphere parallel to the direction of the incident beam electric field polarization. Magnetic wave resonances were found to be excited by moving the focal point from on-center towards the edge of the sphere perpendicular to the direction of the incident beam electric field polarization.

AB - The spherical particle/arbitrary beam interaction theory developed in an earlier paper is used to investigate the dependence of structural resonance behavior on focal point positioning for a spherical particle illuminated by a tightly focused (beam diameter less than sphere diameter), linearly polarized, Gaussian-profiled laser beam. Calculations of absorption efficiency and distributions of normalized source function (electric field magnitude) are presented as a function of focal point positioning for a particle with a complex relative index of refraction of n̄=1.33+5.0×10- 6i and a size parameter of α≊29.5 at both nonresonance and resonance conditions. The results of the calculations indicate that structural resonances are not excited during the on-center focal point positioning of such a tightly focused beam but structural resonances can be excited by proper on-edge focal point positioning. Electric wave resonances were found to be excited by moving the focal point from on-center towards the edge of the sphere parallel to the direction of the incident beam electric field polarization. Magnetic wave resonances were found to be excited by moving the focal point from on-center towards the edge of the sphere perpendicular to the direction of the incident beam electric field polarization.

UR - http://www.scopus.com/inward/record.url?scp=36549101234&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=36549101234&partnerID=8YFLogxK

U2 - 10.1063/1.342736

DO - 10.1063/1.342736

M3 - Article

AN - SCOPUS:36549101234

VL - 65

SP - 2900

EP - 2906

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 8

ER -