Infrared to vacuum-ultraviolet ellipsometry and optical Hall-effect study of free-charge carrier parameters in Mg-doped InN

S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, Mathias Schubert

Research output: Contribution to journalArticle

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Abstract

Infrared to vacuum-ultraviolet spectroscopic ellipsometry and far-infrared optical Hall-effect measurements are applied to conclude on successful p-type doping of InN films. A representative set of In-polar Mg-doped InN films with Mg concentrations ranging from 1.2 × 10 16 cm - 3 to 3.9 × 10 21 cm - 3 is investigated. The data are compared and discussed in dependence of the Mg concentration. Differences between n-type and p-type conducting samples are identified and explained. p-type conductivity in the Mg concentration range between 1.1 × 10 18 cm - 3 and 2.9 × 10 19 cm - 3 is indicated by the appearance of a dip structure in the infrared spectral region related to a loss in reflectivity of p-polarized light as a consequence of reduced LO phonon plasmon coupling, by vanishing free-charge carrier induced birefringence in the optical Hall-effect measurements, and by a sudden change in phonon-plasmon broadening behavior despite continuous change in the Mg concentration. By modeling the near-infrared-to-vacuum-ultraviolet ellipsometry data, information about layer thickness, electronic interband transitions, as well as surface roughness is extracted in dependence of the Mg concentration. A parameterized model that accounts for the phonon-plasmon coupling is applied for the infrared spectral range to determine the free-charge carrier concentration and mobility parameters in the doped bulk InN layer as well as the GaN template and undoped InN buffer layer. The optical Hall-effect best-match model parameters are consistent with those obtained from infrared ellipsometry analysis.

Original languageEnglish (US)
Article number013502
JournalJournal of Applied Physics
Volume113
Issue number1
DOIs
StatePublished - Jan 7 2013

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ellipsometry
Hall effect
charge carriers
vacuum
polarized light
birefringence
surface roughness
templates
buffers
reflectance
conduction
conductivity
electronics

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Infrared to vacuum-ultraviolet ellipsometry and optical Hall-effect study of free-charge carrier parameters in Mg-doped InN. / Schöche, S.; Hofmann, T.; Darakchieva, V.; Ben Sedrine, N.; Wang, X.; Yoshikawa, A.; Schubert, Mathias.

In: Journal of Applied Physics, Vol. 113, No. 1, 013502, 07.01.2013.

Research output: Contribution to journalArticle

Schöche, S. ; Hofmann, T. ; Darakchieva, V. ; Ben Sedrine, N. ; Wang, X. ; Yoshikawa, A. ; Schubert, Mathias. / Infrared to vacuum-ultraviolet ellipsometry and optical Hall-effect study of free-charge carrier parameters in Mg-doped InN. In: Journal of Applied Physics. 2013 ; Vol. 113, No. 1.
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