Infrared dielectric function spectra and phonon modes with polarization parallel and perpendicular to the c axis of high quality, highly relaxed, and single crystalline wurtzite MgxZn1-xO films with 0≤x≤0.2 prepared by pulsed-laser deposition on c-plane sapphire substrates were obtained from infrared spectroscopic ellipsometry (380-1200cm -1) and Raman scattering studies. A two-mode behavior is found for the modes with E1 symmetry, a lattice mode and an impurity-type mode are obtained for the A1 symmetry phonons. Model dielectric function spectra will become useful for future infrared ellipsometry analysis of complex MgxZn1-xO-based heterostructures.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)