Infrared dielectric function and phonon modes of Mg-rich cubic Mg xZn1-xO (x≥0.67) thin films on sapphire (0001)

C. Bundesmann, M. Schubert, A. Rahm, D. Spemann, H. Hochmuth, M. Lorenz, M. Grundmann

Research output: Contribution to journalArticle

27 Scopus citations

Abstract

Infrared spectroscopic ellipsometry (IRSE) was used for investigating pulse laser deposition (PLD)-grown single-phase cubic MgxZn1-xO thin films. The phonon mode frequencies, their broadening parameters, and the high-frequency line parameter of the dielectric function in the dependence on Mg content were extracted by model line shape analysis. All the parameters demonstrated a systematic variation with x. A decreasing lattice constant was revealed by x-ray diffraction (XRD) analysis.

Original languageEnglish (US)
Pages (from-to)905-907
Number of pages3
JournalApplied Physics Letters
Volume85
Issue number6
DOIs
Publication statusPublished - Aug 9 2004

    Fingerprint

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this