Infrared dielectric function and phonon modes of Mg-rich cubic Mg xZn1-xO (x≥0.67) thin films on sapphire (0001)

C. Bundesmann, M. Schubert, A. Rahm, D. Spemann, H. Hochmuth, M. Lorenz, M. Grundmann

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

Infrared spectroscopic ellipsometry (IRSE) was used for investigating pulse laser deposition (PLD)-grown single-phase cubic MgxZn1-xO thin films. The phonon mode frequencies, their broadening parameters, and the high-frequency line parameter of the dielectric function in the dependence on Mg content were extracted by model line shape analysis. All the parameters demonstrated a systematic variation with x. A decreasing lattice constant was revealed by x-ray diffraction (XRD) analysis.

Original languageEnglish (US)
Pages (from-to)905-907
Number of pages3
JournalApplied Physics Letters
Volume85
Issue number6
DOIs
StatePublished - Aug 9 2004

Fingerprint

sapphire
thin films
laser deposition
ellipsometry
line shape
x ray diffraction
pulses

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Infrared dielectric function and phonon modes of Mg-rich cubic Mg xZn1-xO (x≥0.67) thin films on sapphire (0001). / Bundesmann, C.; Schubert, M.; Rahm, A.; Spemann, D.; Hochmuth, H.; Lorenz, M.; Grundmann, M.

In: Applied Physics Letters, Vol. 85, No. 6, 09.08.2004, p. 905-907.

Research output: Contribution to journalArticle

Bundesmann, C. ; Schubert, M. ; Rahm, A. ; Spemann, D. ; Hochmuth, H. ; Lorenz, M. ; Grundmann, M. / Infrared dielectric function and phonon modes of Mg-rich cubic Mg xZn1-xO (x≥0.67) thin films on sapphire (0001). In: Applied Physics Letters. 2004 ; Vol. 85, No. 6. pp. 905-907.
@article{c54c04ebf25d4d928c08dc627e91f4a1,
title = "Infrared dielectric function and phonon modes of Mg-rich cubic Mg xZn1-xO (x≥0.67) thin films on sapphire (0001)",
abstract = "Infrared spectroscopic ellipsometry (IRSE) was used for investigating pulse laser deposition (PLD)-grown single-phase cubic MgxZn1-xO thin films. The phonon mode frequencies, their broadening parameters, and the high-frequency line parameter of the dielectric function in the dependence on Mg content were extracted by model line shape analysis. All the parameters demonstrated a systematic variation with x. A decreasing lattice constant was revealed by x-ray diffraction (XRD) analysis.",
author = "C. Bundesmann and M. Schubert and A. Rahm and D. Spemann and H. Hochmuth and M. Lorenz and M. Grundmann",
year = "2004",
month = "8",
day = "9",
doi = "10.1063/1.1777797",
language = "English (US)",
volume = "85",
pages = "905--907",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "6",

}

TY - JOUR

T1 - Infrared dielectric function and phonon modes of Mg-rich cubic Mg xZn1-xO (x≥0.67) thin films on sapphire (0001)

AU - Bundesmann, C.

AU - Schubert, M.

AU - Rahm, A.

AU - Spemann, D.

AU - Hochmuth, H.

AU - Lorenz, M.

AU - Grundmann, M.

PY - 2004/8/9

Y1 - 2004/8/9

N2 - Infrared spectroscopic ellipsometry (IRSE) was used for investigating pulse laser deposition (PLD)-grown single-phase cubic MgxZn1-xO thin films. The phonon mode frequencies, their broadening parameters, and the high-frequency line parameter of the dielectric function in the dependence on Mg content were extracted by model line shape analysis. All the parameters demonstrated a systematic variation with x. A decreasing lattice constant was revealed by x-ray diffraction (XRD) analysis.

AB - Infrared spectroscopic ellipsometry (IRSE) was used for investigating pulse laser deposition (PLD)-grown single-phase cubic MgxZn1-xO thin films. The phonon mode frequencies, their broadening parameters, and the high-frequency line parameter of the dielectric function in the dependence on Mg content were extracted by model line shape analysis. All the parameters demonstrated a systematic variation with x. A decreasing lattice constant was revealed by x-ray diffraction (XRD) analysis.

UR - http://www.scopus.com/inward/record.url?scp=4344568557&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=4344568557&partnerID=8YFLogxK

U2 - 10.1063/1.1777797

DO - 10.1063/1.1777797

M3 - Article

AN - SCOPUS:4344568557

VL - 85

SP - 905

EP - 907

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 6

ER -