Infrared spectroscopic ellipsometry (IRSE) was used for investigating pulse laser deposition (PLD)-grown single-phase cubic MgxZn1-xO thin films. The phonon mode frequencies, their broadening parameters, and the high-frequency line parameter of the dielectric function in the dependence on Mg content were extracted by model line shape analysis. All the parameters demonstrated a systematic variation with x. A decreasing lattice constant was revealed by x-ray diffraction (XRD) analysis.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)