Infrared behavior of aluminum nanostructure sculptured thin films

T. Hofmann, Mathias Schubert, D. Schmidt, E. Schubert

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report on fabrication, structural and infrared optical characterization of nanostructure aluminum sculptured thin films prepared by glancing angle deposition (GLAD) and controlled substrate motion on p-type silicon. We discuss two structures, one with plate-like and one with screw-like (chiral) morphology. While the plate-like sample possesses a metal Drude behavior in the infrared spectral range, the chiral nanowire sample behaves non-metallic and reveals a series of intriguing resonances, which are equally spaced in frequency by ∼7.5 THz. We suggest that formation of 3D nano resonator circuits consisting of inductances and capacitances has occurred within the screw-like conductive aluminum wire sample, which might be responsible for the observed resonances. We suggest conductive GLAD nanostructures in combination with Schottky diodes to facilitate active or passive THz detector and transmitter devices.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium Proceedings - Semiconductor Nanowires-Growth, Physics, Devices and Applications
Pages71-76
Number of pages6
StatePublished - Dec 1 2008
EventSemiconductor Nanowires-Growth, Physics, Devices and Applications - San Francisco, CA, United States
Duration: Mar 24 2008Mar 28 2008

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1080
ISSN (Print)0272-9172

Other

OtherSemiconductor Nanowires-Growth, Physics, Devices and Applications
CountryUnited States
CitySan Francisco, CA
Period3/24/083/28/08

Fingerprint

Aluminum
Nanostructures
screws
Infrared radiation
aluminum
Thin films
Silicon
thin films
Inductance
Nanowires
Resonators
Transmitters
Diodes
Capacitance
Metals
Wire
Schottky diodes
Detectors
Fabrication
inductance

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Hofmann, T., Schubert, M., Schmidt, D., & Schubert, E. (2008). Infrared behavior of aluminum nanostructure sculptured thin films. In Materials Research Society Symposium Proceedings - Semiconductor Nanowires-Growth, Physics, Devices and Applications (pp. 71-76). (Materials Research Society Symposium Proceedings; Vol. 1080).

Infrared behavior of aluminum nanostructure sculptured thin films. / Hofmann, T.; Schubert, Mathias; Schmidt, D.; Schubert, E.

Materials Research Society Symposium Proceedings - Semiconductor Nanowires-Growth, Physics, Devices and Applications. 2008. p. 71-76 (Materials Research Society Symposium Proceedings; Vol. 1080).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hofmann, T, Schubert, M, Schmidt, D & Schubert, E 2008, Infrared behavior of aluminum nanostructure sculptured thin films. in Materials Research Society Symposium Proceedings - Semiconductor Nanowires-Growth, Physics, Devices and Applications. Materials Research Society Symposium Proceedings, vol. 1080, pp. 71-76, Semiconductor Nanowires-Growth, Physics, Devices and Applications, San Francisco, CA, United States, 3/24/08.
Hofmann T, Schubert M, Schmidt D, Schubert E. Infrared behavior of aluminum nanostructure sculptured thin films. In Materials Research Society Symposium Proceedings - Semiconductor Nanowires-Growth, Physics, Devices and Applications. 2008. p. 71-76. (Materials Research Society Symposium Proceedings).
Hofmann, T. ; Schubert, Mathias ; Schmidt, D. ; Schubert, E. / Infrared behavior of aluminum nanostructure sculptured thin films. Materials Research Society Symposium Proceedings - Semiconductor Nanowires-Growth, Physics, Devices and Applications. 2008. pp. 71-76 (Materials Research Society Symposium Proceedings).
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