In situ synthesis of palladium nanoparticles in polymer brushes followed by QCM-D coupled with spectroscopic ellipsometry

Meike Koenig, Keith Brian Rodenhausen, Daniel Schmidt, Klaus Jochen Eichhorn, Mathias Schubert, Manfred Stamm, Petra Uhlmann

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The combinatorial method of quartz crystal microbalance coupled with spectroscopic ellipsometry can be used to follow the in situ synthesis of catalytically active palladium nanoparticles in polymer brushes in situ. By combining these two orthogonal techniques, it is possible to thoroughly characterize the thickness, composition, optical, and mechanical properties of nanoscopic thin films.

Original languageEnglish (US)
Pages (from-to)931-935
Number of pages5
JournalParticle and Particle Systems Characterization
Volume30
Issue number11
DOIs
StatePublished - Nov 1 2013

Fingerprint

Spectroscopic ellipsometry
Quartz crystal microbalances
brushes
Palladium
Brushes
quartz crystals
microbalances
ellipsometry
palladium
Polymers
Optical properties
mechanical properties
Nanoparticles
optical properties
Thin films
Mechanical properties
nanoparticles
polymers
synthesis
thin films

Keywords

  • in situ synthesis
  • nanocatalysts
  • nanocomposites
  • polymer brushes
  • thin films

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

In situ synthesis of palladium nanoparticles in polymer brushes followed by QCM-D coupled with spectroscopic ellipsometry. / Koenig, Meike; Rodenhausen, Keith Brian; Schmidt, Daniel; Eichhorn, Klaus Jochen; Schubert, Mathias; Stamm, Manfred; Uhlmann, Petra.

In: Particle and Particle Systems Characterization, Vol. 30, No. 11, 01.11.2013, p. 931-935.

Research output: Contribution to journalArticle

Koenig, Meike ; Rodenhausen, Keith Brian ; Schmidt, Daniel ; Eichhorn, Klaus Jochen ; Schubert, Mathias ; Stamm, Manfred ; Uhlmann, Petra. / In situ synthesis of palladium nanoparticles in polymer brushes followed by QCM-D coupled with spectroscopic ellipsometry. In: Particle and Particle Systems Characterization. 2013 ; Vol. 30, No. 11. pp. 931-935.
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