Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes

Y. S. Zhou, K. J. Yi, M. Mahjouri-Samani, W. Xiong, Y. F. Lu, S. H. Liou

Research output: Contribution to journalArticle

7 Scopus citations

Abstract

The image contrast enhancement in scanning electron microscopy of single-walled carbon nanotubes (SWNTs) on SiO 2 surfaces was experimentally investigated using a field-emission scanning electron microscope (FESEM) using a wide range of primary electron (PE) voltages. SWNT images of different contrasts were obtained at different PE voltages. Image contrast enhancement of SWNTs was investigated by charging SiO 2 surfaces at different PE voltages. The phenomena are ascribed to the surface potential difference and charge injection between SWNTs and SiO 2 substrates induced by the electron-beam irradiation.

Original languageEnglish (US)
Pages (from-to)4341-4346
Number of pages6
JournalApplied Surface Science
Volume255
Issue number7
DOIs
StatePublished - Jan 15 2009

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Keywords

  • Field-emission scanning electron microscopy
  • Single-walled carbon nanotubes

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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