Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes

Y. S. Zhou, K. J. Yi, M. Mahjouri-Samani, W. Xiong, Yongfeng Lu, Sy-Hwang Liou

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The image contrast enhancement in scanning electron microscopy of single-walled carbon nanotubes (SWNTs) on SiO 2 surfaces was experimentally investigated using a field-emission scanning electron microscope (FESEM) using a wide range of primary electron (PE) voltages. SWNT images of different contrasts were obtained at different PE voltages. Image contrast enhancement of SWNTs was investigated by charging SiO 2 surfaces at different PE voltages. The phenomena are ascribed to the surface potential difference and charge injection between SWNTs and SiO 2 substrates induced by the electron-beam irradiation.

Original languageEnglish (US)
Pages (from-to)4341-4346
Number of pages6
JournalApplied Surface Science
Volume255
Issue number7
DOIs
StatePublished - Jan 15 2009

Fingerprint

image contrast
Single-walled carbon nanotubes (SWCN)
Field emission
field emission
carbon nanotubes
Scanning electron microscopy
scanning electron microscopy
augmentation
Electrons
Electric potential
electric potential
Charge injection
electrons
Surface potential
charging
Electron beams
Electron microscopes
electron microscopes
Irradiation
electron beams

Keywords

  • Field-emission scanning electron microscopy
  • Single-walled carbon nanotubes

ASJC Scopus subject areas

  • Surfaces, Coatings and Films

Cite this

Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes. / Zhou, Y. S.; Yi, K. J.; Mahjouri-Samani, M.; Xiong, W.; Lu, Yongfeng; Liou, Sy-Hwang.

In: Applied Surface Science, Vol. 255, No. 7, 15.01.2009, p. 4341-4346.

Research output: Contribution to journalArticle

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AU - Lu, Yongfeng

AU - Liou, Sy-Hwang

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