High precision positioning control for SPM based nanomanipulation: A robust adaptive model reference control approach

Bo Song, Zhiyong Sun, Ning Xi, Ruiguo Yang, Liangliang Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

Scanning probe microscope (SPM) based nanomanipulations have been successfully applied to various fields to explore and study the unique structures and properties in the nano world. SPM has the ability to manipulate nanoparticles and modify a sample surface in nano scale. Therefore, the positioning accuracy of the SPM probe is the crucial for nanomanipulations. In general, the precision of SPM based nanomanipulations has been limited mainly by hysteresis, creep and drift of the piezo actuator. In this research, a new control strategy named hysteresis creep inverse based robust adaptive model reference control (RAMRC) is proposed to reduce the hysteresis, creep and system drift of the SPM scanner for improving the positioning accuracy of nanomanipulations. The RAMRC approach uses a compensator to compensate the hysteresis and creep. In addition, to tackle the unknown drift, the RAMRC also has a robust adaptive controller to explicitly deals with the noise and disturbance. This is suitable for manipulating nano-objects in a noisy environment, which is difficult for fixed operators/parameters based compensators and controllers. Additionally, the numerical experimental results support the RAMRC theory well and the position error can be controlled within approximate ten nanometers based on simulation results.

Original languageEnglish (US)
Title of host publicationAIM 2014 - IEEE/ASME International Conference on Advanced Intelligent Mechatronics
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1658-1663
Number of pages6
ISBN (Print)9781479957361
DOIs
StatePublished - Jan 1 2014
Event2014 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2014 - Besancon, France
Duration: Jul 8 2014Jul 11 2014

Publication series

NameIEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM

Other

Other2014 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2014
CountryFrance
CityBesancon
Period7/8/147/11/14

Fingerprint

Model reference adaptive control
Microscopes
Scanning
Hysteresis
Creep
Controllers
Control theory
Actuators
Nanoparticles

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Software
  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Song, B., Sun, Z., Xi, N., Yang, R., & Chen, L. (2014). High precision positioning control for SPM based nanomanipulation: A robust adaptive model reference control approach. In AIM 2014 - IEEE/ASME International Conference on Advanced Intelligent Mechatronics (pp. 1658-1663). [6878322] (IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/AIM.2014.6878322

High precision positioning control for SPM based nanomanipulation : A robust adaptive model reference control approach. / Song, Bo; Sun, Zhiyong; Xi, Ning; Yang, Ruiguo; Chen, Liangliang.

AIM 2014 - IEEE/ASME International Conference on Advanced Intelligent Mechatronics. Institute of Electrical and Electronics Engineers Inc., 2014. p. 1658-1663 6878322 (IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Song, B, Sun, Z, Xi, N, Yang, R & Chen, L 2014, High precision positioning control for SPM based nanomanipulation: A robust adaptive model reference control approach. in AIM 2014 - IEEE/ASME International Conference on Advanced Intelligent Mechatronics., 6878322, IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM, Institute of Electrical and Electronics Engineers Inc., pp. 1658-1663, 2014 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2014, Besancon, France, 7/8/14. https://doi.org/10.1109/AIM.2014.6878322
Song B, Sun Z, Xi N, Yang R, Chen L. High precision positioning control for SPM based nanomanipulation: A robust adaptive model reference control approach. In AIM 2014 - IEEE/ASME International Conference on Advanced Intelligent Mechatronics. Institute of Electrical and Electronics Engineers Inc. 2014. p. 1658-1663. 6878322. (IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM). https://doi.org/10.1109/AIM.2014.6878322
Song, Bo ; Sun, Zhiyong ; Xi, Ning ; Yang, Ruiguo ; Chen, Liangliang. / High precision positioning control for SPM based nanomanipulation : A robust adaptive model reference control approach. AIM 2014 - IEEE/ASME International Conference on Advanced Intelligent Mechatronics. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 1658-1663 (IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM).
@inproceedings{b1780d5f9023478f932cf6f4be7fa0ab,
title = "High precision positioning control for SPM based nanomanipulation: A robust adaptive model reference control approach",
abstract = "Scanning probe microscope (SPM) based nanomanipulations have been successfully applied to various fields to explore and study the unique structures and properties in the nano world. SPM has the ability to manipulate nanoparticles and modify a sample surface in nano scale. Therefore, the positioning accuracy of the SPM probe is the crucial for nanomanipulations. In general, the precision of SPM based nanomanipulations has been limited mainly by hysteresis, creep and drift of the piezo actuator. In this research, a new control strategy named hysteresis creep inverse based robust adaptive model reference control (RAMRC) is proposed to reduce the hysteresis, creep and system drift of the SPM scanner for improving the positioning accuracy of nanomanipulations. The RAMRC approach uses a compensator to compensate the hysteresis and creep. In addition, to tackle the unknown drift, the RAMRC also has a robust adaptive controller to explicitly deals with the noise and disturbance. This is suitable for manipulating nano-objects in a noisy environment, which is difficult for fixed operators/parameters based compensators and controllers. Additionally, the numerical experimental results support the RAMRC theory well and the position error can be controlled within approximate ten nanometers based on simulation results.",
author = "Bo Song and Zhiyong Sun and Ning Xi and Ruiguo Yang and Liangliang Chen",
year = "2014",
month = "1",
day = "1",
doi = "10.1109/AIM.2014.6878322",
language = "English (US)",
isbn = "9781479957361",
series = "IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1658--1663",
booktitle = "AIM 2014 - IEEE/ASME International Conference on Advanced Intelligent Mechatronics",

}

TY - GEN

T1 - High precision positioning control for SPM based nanomanipulation

T2 - A robust adaptive model reference control approach

AU - Song, Bo

AU - Sun, Zhiyong

AU - Xi, Ning

AU - Yang, Ruiguo

AU - Chen, Liangliang

PY - 2014/1/1

Y1 - 2014/1/1

N2 - Scanning probe microscope (SPM) based nanomanipulations have been successfully applied to various fields to explore and study the unique structures and properties in the nano world. SPM has the ability to manipulate nanoparticles and modify a sample surface in nano scale. Therefore, the positioning accuracy of the SPM probe is the crucial for nanomanipulations. In general, the precision of SPM based nanomanipulations has been limited mainly by hysteresis, creep and drift of the piezo actuator. In this research, a new control strategy named hysteresis creep inverse based robust adaptive model reference control (RAMRC) is proposed to reduce the hysteresis, creep and system drift of the SPM scanner for improving the positioning accuracy of nanomanipulations. The RAMRC approach uses a compensator to compensate the hysteresis and creep. In addition, to tackle the unknown drift, the RAMRC also has a robust adaptive controller to explicitly deals with the noise and disturbance. This is suitable for manipulating nano-objects in a noisy environment, which is difficult for fixed operators/parameters based compensators and controllers. Additionally, the numerical experimental results support the RAMRC theory well and the position error can be controlled within approximate ten nanometers based on simulation results.

AB - Scanning probe microscope (SPM) based nanomanipulations have been successfully applied to various fields to explore and study the unique structures and properties in the nano world. SPM has the ability to manipulate nanoparticles and modify a sample surface in nano scale. Therefore, the positioning accuracy of the SPM probe is the crucial for nanomanipulations. In general, the precision of SPM based nanomanipulations has been limited mainly by hysteresis, creep and drift of the piezo actuator. In this research, a new control strategy named hysteresis creep inverse based robust adaptive model reference control (RAMRC) is proposed to reduce the hysteresis, creep and system drift of the SPM scanner for improving the positioning accuracy of nanomanipulations. The RAMRC approach uses a compensator to compensate the hysteresis and creep. In addition, to tackle the unknown drift, the RAMRC also has a robust adaptive controller to explicitly deals with the noise and disturbance. This is suitable for manipulating nano-objects in a noisy environment, which is difficult for fixed operators/parameters based compensators and controllers. Additionally, the numerical experimental results support the RAMRC theory well and the position error can be controlled within approximate ten nanometers based on simulation results.

UR - http://www.scopus.com/inward/record.url?scp=84906692371&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84906692371&partnerID=8YFLogxK

U2 - 10.1109/AIM.2014.6878322

DO - 10.1109/AIM.2014.6878322

M3 - Conference contribution

AN - SCOPUS:84906692371

SN - 9781479957361

T3 - IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM

SP - 1658

EP - 1663

BT - AIM 2014 - IEEE/ASME International Conference on Advanced Intelligent Mechatronics

PB - Institute of Electrical and Electronics Engineers Inc.

ER -