Growth and magnetic properties of La 0.65Pb 0.35MnO 3 films

Q. L. Xu, M. T. Liu, Y. Liu, C. N. Borca, H. Dulli, P. A. Dowben, Sy-Hwang Liou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

We have successfully grown La 0.65Pb 0.35MnO 3 thin films by a RF magnetron sputtering method onto (100) LaAlO 3 single crystal substrates. X-ray diffraction measurements are consistent with a (100) cubic orientation of the films. The fourfold symmetry showed by LEED(Low Energy Electron Diffraction) patterns indicate that the films have surface order. STM(Scanning Tunneling Microscopy) measurements indicate that the surface of the films were smooth, with approximate 5 nm roughness. XPS (X-ray Photoemission Spectroscopy) shows that the surface defect density in the films is comparatively low. The bulk magnetization of the films at 6K in 1 T magnetic field reached 77 emu/g and a Curie temperature near 354 K, close to maximum resistivity. A negative magnetoresistance of 47% was observed at 320K in 5.5 T magnetic field.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium - Proceedings
EditorsM.S. Rzchowski, M. Kawasaki, A.J. Millis, S. Molnar, M. Rajeswari
Pages75-80
Number of pages6
Volume602
StatePublished - 2000
EventMagnetoresistive Oxides and Related Materials - Boston, MA, United States
Duration: Nov 29 1999Dec 2 1999

Other

OtherMagnetoresistive Oxides and Related Materials
CountryUnited States
CityBoston, MA
Period11/29/9912/2/99

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Magnetic properties
Magnetic fields
Low energy electron diffraction
Defect density
Surface defects
Scanning tunneling microscopy
Magnetoresistance
Photoelectron spectroscopy
Curie temperature
X ray spectroscopy
Magnetron sputtering
Diffraction patterns
Magnetization
Surface roughness
Single crystals
X ray diffraction
Thin films
Substrates

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Xu, Q. L., Liu, M. T., Liu, Y., Borca, C. N., Dulli, H., Dowben, P. A., & Liou, S-H. (2000). Growth and magnetic properties of La 0.65Pb 0.35MnO 3 films In M. S. Rzchowski, M. Kawasaki, A. J. Millis, S. Molnar, & M. Rajeswari (Eds.), Materials Research Society Symposium - Proceedings (Vol. 602, pp. 75-80)

Growth and magnetic properties of La 0.65Pb 0.35MnO 3 films . / Xu, Q. L.; Liu, M. T.; Liu, Y.; Borca, C. N.; Dulli, H.; Dowben, P. A.; Liou, Sy-Hwang.

Materials Research Society Symposium - Proceedings. ed. / M.S. Rzchowski; M. Kawasaki; A.J. Millis; S. Molnar; M. Rajeswari. Vol. 602 2000. p. 75-80.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Xu, QL, Liu, MT, Liu, Y, Borca, CN, Dulli, H, Dowben, PA & Liou, S-H 2000, Growth and magnetic properties of La 0.65Pb 0.35MnO 3 films in MS Rzchowski, M Kawasaki, AJ Millis, S Molnar & M Rajeswari (eds), Materials Research Society Symposium - Proceedings. vol. 602, pp. 75-80, Magnetoresistive Oxides and Related Materials, Boston, MA, United States, 11/29/99.
Xu QL, Liu MT, Liu Y, Borca CN, Dulli H, Dowben PA et al. Growth and magnetic properties of La 0.65Pb 0.35MnO 3 films In Rzchowski MS, Kawasaki M, Millis AJ, Molnar S, Rajeswari M, editors, Materials Research Society Symposium - Proceedings. Vol. 602. 2000. p. 75-80
Xu, Q. L. ; Liu, M. T. ; Liu, Y. ; Borca, C. N. ; Dulli, H. ; Dowben, P. A. ; Liou, Sy-Hwang. / Growth and magnetic properties of La 0.65Pb 0.35MnO 3 films Materials Research Society Symposium - Proceedings. editor / M.S. Rzchowski ; M. Kawasaki ; A.J. Millis ; S. Molnar ; M. Rajeswari. Vol. 602 2000. pp. 75-80
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AU - Dowben, P. A.

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N2 - We have successfully grown La 0.65Pb 0.35MnO 3 thin films by a RF magnetron sputtering method onto (100) LaAlO 3 single crystal substrates. X-ray diffraction measurements are consistent with a (100) cubic orientation of the films. The fourfold symmetry showed by LEED(Low Energy Electron Diffraction) patterns indicate that the films have surface order. STM(Scanning Tunneling Microscopy) measurements indicate that the surface of the films were smooth, with approximate 5 nm roughness. XPS (X-ray Photoemission Spectroscopy) shows that the surface defect density in the films is comparatively low. The bulk magnetization of the films at 6K in 1 T magnetic field reached 77 emu/g and a Curie temperature near 354 K, close to maximum resistivity. A negative magnetoresistance of 47% was observed at 320K in 5.5 T magnetic field.

AB - We have successfully grown La 0.65Pb 0.35MnO 3 thin films by a RF magnetron sputtering method onto (100) LaAlO 3 single crystal substrates. X-ray diffraction measurements are consistent with a (100) cubic orientation of the films. The fourfold symmetry showed by LEED(Low Energy Electron Diffraction) patterns indicate that the films have surface order. STM(Scanning Tunneling Microscopy) measurements indicate that the surface of the films were smooth, with approximate 5 nm roughness. XPS (X-ray Photoemission Spectroscopy) shows that the surface defect density in the films is comparatively low. The bulk magnetization of the films at 6K in 1 T magnetic field reached 77 emu/g and a Curie temperature near 354 K, close to maximum resistivity. A negative magnetoresistance of 47% was observed at 320K in 5.5 T magnetic field.

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