Generalized ellipsometry in-situ quantification of organic adsorbate attachment within slanted columnar thin films

Keith B. Rodenhausen, Daniel Schmidt, Tadas Kasputis, Angela K. Pannier, Eva Schubert, Mathias Schubert

Research output: Contribution to journalArticle

31 Citations (Scopus)

Abstract

We apply generalized ellipsometry, well-known to be sensitive to the optical properties of anisotropic materials, to determine the amount of fibronectin protein that adsorbs onto a Ti slanted columnar thin film from solution. We find that the anisotropic optical properties of the thin film change upon organic adsorption. An optical model for ellipsometry data analysis incorporates an anisotropic Bruggeman effective medium approximation. We find that differences in experimental data from before and after fibronectin adsorption can be solely attributable to the uptake of fibronectin within the slanted columnar thin film. Simultaneous, in-situ generalized ellipsometry and quartz crystal microbalance measurements show excellent agreement on the amount and rate of fibronectin adsorption. Quantitative characterization of organic materials within three-dimensional, optically anisotropic slanted columnar thin films could permit their use in optical sensor applications.

Original languageEnglish (US)
Pages (from-to)5419-5428
Number of pages10
JournalOptics Express
Volume20
Issue number5
DOIs
StatePublished - Feb 27 2012

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ellipsometry
attachment
thin films
adsorption
optical properties
optical measuring instruments
organic materials
quartz crystals
microbalances
proteins
approximation
crystals

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Generalized ellipsometry in-situ quantification of organic adsorbate attachment within slanted columnar thin films. / Rodenhausen, Keith B.; Schmidt, Daniel; Kasputis, Tadas; Pannier, Angela K.; Schubert, Eva; Schubert, Mathias.

In: Optics Express, Vol. 20, No. 5, 27.02.2012, p. 5419-5428.

Research output: Contribution to journalArticle

Rodenhausen, Keith B. ; Schmidt, Daniel ; Kasputis, Tadas ; Pannier, Angela K. ; Schubert, Eva ; Schubert, Mathias. / Generalized ellipsometry in-situ quantification of organic adsorbate attachment within slanted columnar thin films. In: Optics Express. 2012 ; Vol. 20, No. 5. pp. 5419-5428.
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