Generalized ellipsometry for orthorhombic, absorbing materials

Dielectric functions, phonon modes and band-to-band transitions of Sb2S 3

Mathias Schubert, T. Hofmann, C. M. Herzinger, W. Dollase

Research output: Contribution to journalConference article

18 Citations (Scopus)

Abstract

Generalized ellipsometry allows complete extraction of the dielectric function tensor, including orientation, from measurement of skew-cut single crystal orthorhombic absorbing materials. As an example, Stibnite (Sb 2S3) is studied to determine fundamental phonon modes and band-to-band transitions, which are here provided for polarization along axes a, b, and c from lineshape analysis of the major dielectric function spectra.

Original languageEnglish (US)
Pages (from-to)619-623
Number of pages5
JournalThin Solid Films
Volume455-456
DOIs
StatePublished - May 1 2004
EventThe 3rd International Conference on Spectroscopic Ellipsometry - Vienna, Austria
Duration: Jul 6 2003Jul 11 2003

Fingerprint

Ellipsometry
ellipsometry
Crystal orientation
Tensors
Single crystals
tensors
Polarization
single crystals
polarization

Keywords

  • Anisotropy
  • Band-to-band transitions
  • Dielectric functions
  • Generalized ellipsometry
  • Phonon modes
  • Stibnite

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

Generalized ellipsometry for orthorhombic, absorbing materials : Dielectric functions, phonon modes and band-to-band transitions of Sb2S 3. / Schubert, Mathias; Hofmann, T.; Herzinger, C. M.; Dollase, W.

In: Thin Solid Films, Vol. 455-456, 01.05.2004, p. 619-623.

Research output: Contribution to journalConference article

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