Generalized ellipsometry for biaxial absorbing materials: Determination of crystal orientation and optical constants of Sb2S3

Mathias Schubert, Wayne Dollase

Research output: Contribution to journalArticle

33 Scopus citations

Abstract

We demonstrate generalized ellipsometry for precise measurement of the principal indices of refraction, the extinction coefficients, and the orientations of the crystal a, b, and c axes of orthorhombic absorbing materials. Stibnite (Sb2S3) single crystals cut approximately parallel to (100), (010), (001), and (313) are studied at a representative wavelength of 589 nm. The (313) surface is sufficient for retrieval of all optical constants. The expected effects of surface over-layer formation are removed numerically. We propose generalized ellipsometry as a powerful tool for measurement of anisotropic optical function spectra of biaxial materials.

Original languageEnglish (US)
Pages (from-to)2073-2075
Number of pages3
JournalOptics Letters
Volume27
Issue number23
DOIs
Publication statusPublished - Dec 1 2002

    Fingerprint

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this