Generalized ellipsometry determination of non-reciprocity in chiral silicon sculptured thin films

D. Schmidt, E. Schubert, M. Schubert

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

We report on angle-resolved reflection-type generalized ellipsometry investigations of form-birefringent chiral silcon sculptured thin films. The nanodimensional structures within the sculptured thin films are designed in geometries of left-handed hollow-core three-, four-, and five-fold, and solid-core continuous screws. We identify their structurally induced non-reciprocal optical properties by comparison between off-diagonal Mueller matrix elements upon reversal of the light direction. The observed non-reciprocity cannot be described by the piecewise homogeneous approximation scheme using chiral arrangements of dielectrically anisotropic but non-chiral surface produces non-reciprocity. We provide estimates of the optical rotary power of the nanostructures.

Original languageEnglish (US)
Pages (from-to)748-751
Number of pages4
JournalPhysica Status Solidi (A) Applications and Materials Science
Volume205
Issue number4
DOIs
StatePublished - Apr 1 2008

Fingerprint

Ellipsometry
Silicon
ellipsometry
Thin films
silicon
screws
thin films
hollow
Nanostructures
Optical properties
optical properties
Geometry
estimates
matrices
geometry
approximation
Direction compound

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering
  • Materials Chemistry

Cite this

Generalized ellipsometry determination of non-reciprocity in chiral silicon sculptured thin films. / Schmidt, D.; Schubert, E.; Schubert, M.

In: Physica Status Solidi (A) Applications and Materials Science, Vol. 205, No. 4, 01.04.2008, p. 748-751.

Research output: Contribution to journalArticle

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