Future of semiconductor based thermal neutron detectors

R. J. Nikolić, Chin Li "Barry" Cheung, C. E. Reinhardt, T. F. Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Thermal neutron detectors have seen only incremental improvements over the last decades. In this paper we overview the current technology of choice for thermal neutron detection - 3He tubes, which suffer from, moderate to poor fieldability, and low absolute efficiency. The need for improved neutron detection is evident due to this technology gap and the fact that neutrons are a highly specific indicator of fissile material. Recognizing this need, we propose to exploit recent advances in microfabrication technology for building the next generation of semiconductor thermal neutron detectors for national security requirements, for applications requiring excellent fieldability of small devices. We have developed an innovative pathway taking advantage of advanced processing and fabrication technology to produce the proposed device. The crucial advantage of our Pillar Detector is that it can simultaneously meet the requirements of high efficiency and fieldability in the optimized configuration, the detector efficiency could be higher than 70%.

Original languageEnglish (US)
Title of host publication2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings
Pages166-169
Number of pages4
StatePublished - Dec 8 2006
Event2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings - Boston, MA, United States
Duration: May 7 2006May 11 2006

Publication series

Name2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings
Volume2

Conference

Conference2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings
CountryUnited States
CityBoston, MA
Period5/7/065/11/06

Fingerprint

Neutron detectors
Semiconductor materials
Neutrons
Detectors
National security
Microfabrication
Fabrication
Hot Temperature
Processing

Keywords

  • High aspect ratio etching
  • Pillar
  • Thermal neutron detector

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Nikolić, R. J., Cheung, C. L. B., Reinhardt, C. E., & Wang, T. F. (2006). Future of semiconductor based thermal neutron detectors. In 2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings (pp. 166-169). (2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings; Vol. 2).

Future of semiconductor based thermal neutron detectors. / Nikolić, R. J.; Cheung, Chin Li "Barry"; Reinhardt, C. E.; Wang, T. F.

2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings. 2006. p. 166-169 (2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings; Vol. 2).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nikolić, RJ, Cheung, CLB, Reinhardt, CE & Wang, TF 2006, Future of semiconductor based thermal neutron detectors. in 2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings. 2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings, vol. 2, pp. 166-169, 2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings, Boston, MA, United States, 5/7/06.
Nikolić RJ, Cheung CLB, Reinhardt CE, Wang TF. Future of semiconductor based thermal neutron detectors. In 2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings. 2006. p. 166-169. (2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings).
Nikolić, R. J. ; Cheung, Chin Li "Barry" ; Reinhardt, C. E. ; Wang, T. F. / Future of semiconductor based thermal neutron detectors. 2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings. 2006. pp. 166-169 (2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings).
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