Force-frequency effect of thickness mode langasite resonators

Haifeng Zhang, Joseph A. Turner, Jiashi Yang, John A. Kosinski

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

Langasite resonators are of recent interest for a variety of applications because of their good temperature behavior, good piezoelectric coupling, low acoustic loss and high Q factor. The force-frequency effect describes the shift in resonant frequency a resonator experiences due to the application of a mechanical load. A clear understanding of this effect is essential for many design applications such as pressure sensors. In this article, the frequency shift is analyzed theoretically and numerically for thin, circular langasite plates subjected to a pair of diametrical forces. In addition, the sensitivity of the force-frequency effect is analyzed with respect to the nonlinear material constants. The results are anticipated to be valuable for experimental measurements of nonlinear material constants as well as for device design.

Original languageEnglish (US)
Pages (from-to)479-490
Number of pages12
JournalUltrasonics
Volume50
Issue number4-5
DOIs
StatePublished - Apr 1 2010

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resonators
Q factors
circular plates
pressure sensors
frequency shift
resonant frequencies
acoustics
sensitivity
shift
temperature

Keywords

  • Force-frequency effect
  • Langasite
  • Resonators

ASJC Scopus subject areas

  • Acoustics and Ultrasonics

Cite this

Force-frequency effect of thickness mode langasite resonators. / Zhang, Haifeng; Turner, Joseph A.; Yang, Jiashi; Kosinski, John A.

In: Ultrasonics, Vol. 50, No. 4-5, 01.04.2010, p. 479-490.

Research output: Contribution to journalArticle

Zhang, Haifeng ; Turner, Joseph A. ; Yang, Jiashi ; Kosinski, John A. / Force-frequency effect of thickness mode langasite resonators. In: Ultrasonics. 2010 ; Vol. 50, No. 4-5. pp. 479-490.
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