Femtosecond thermomodulation measurements of Co/Cu and Ag/Cu multilayer films

Ding Liu, Ping He, Dennis R Alexander

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Femtosecond transient reflectivities of Co/Cu and Ag/Cu multilayer films were measured to study the electron-lattice relaxation in these systems. The measurement results suggest that the thickness of Cu layers does not influence the electron relaxation time. A slow decaying signal, which is absent in Ag/Cu films, was observed in Co/Cu films and it is attributed to the spin excitations in the Co layers.

Original languageEnglish (US)
Pages (from-to)249-251
Number of pages3
JournalApplied Physics Letters
Volume62
Issue number3
DOIs
StatePublished - Dec 1 1993

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electrons
relaxation time
reflectance
excitation

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Femtosecond thermomodulation measurements of Co/Cu and Ag/Cu multilayer films. / Liu, Ding; He, Ping; Alexander, Dennis R.

In: Applied Physics Letters, Vol. 62, No. 3, 01.12.1993, p. 249-251.

Research output: Contribution to journalArticle

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