Far-infrared magneto-optical generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures

T. Hofmann, M. Schubert, C. M. Herzinger

Research output: Contribution to journalConference article

4 Scopus citations

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Keywords

  • Ellipsometry
  • Free-carrier properties
  • Magneto-optic birefringence

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering