Experimental measurements of the force-frequency effect of thickness-mode langasite resonators

Haifeng Zhang, Joseph Turner, John A. Kosinski

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Because of their excellent temperature behavior, high piezoelectric coupling, low acoustic loss, and high Q-factor, langasite resonators have been the subject of recent interest for use in a variety of applications. The force¿frequency effect refers to the phenomenon of frequency changes resulting from the stress applied to the resonator. A clear understanding of this effect is essential for many design applications such as force sensors and stress-compensated resonators. In this article, we report on experimental measurements of the force¿ frequency effect of various doubly-rotated langasite resonator samples with plano-plano configurations. Comparisons with the available experimental data for the force¿frequency effect of quartz resonators are made. The application of this effect for sensors and stress-compensated resonators is also discussed.

Original languageEnglish (US)
Article number6552397
Pages (from-to)1475-1478
Number of pages4
JournalIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume60
Issue number7
DOIs
StatePublished - Jul 26 2013

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Resonators
resonators
Q factors
sensors
Sensors
Quartz
quartz
Acoustics
acoustics
configurations
Temperature
temperature

ASJC Scopus subject areas

  • Instrumentation
  • Acoustics and Ultrasonics
  • Electrical and Electronic Engineering

Cite this

Experimental measurements of the force-frequency effect of thickness-mode langasite resonators. / Zhang, Haifeng; Turner, Joseph; Kosinski, John A.

In: IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, Vol. 60, No. 7, 6552397, 26.07.2013, p. 1475-1478.

Research output: Contribution to journalArticle

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