Evaluation of the real-time protein adsorption kinetics on albumin-binding surfaces by dynamic in situ spectroscopic ellipsometry

Sanjukta Guha Thakurta, Hendrik J Viljoen, Anuradha Subramanian

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Functionalized surfaces with an affinity for albumin over competing serum proteins were prepared by immobilizing linear peptides or a small chemical ligand (SCL) with albumin-binding properties on silanized silicon surfaces. The real time adsorption of human serum albumin from single- and multi-component systems was monitored by dynamic ellipsometry. The experimentally obtained time-dependent adsorption data were analyzed by two models: a) a pseudo-first-order model and b) a biphasic kinetic model that accounted for the formation of tightly and loosely bound complexes. The biphasic kinetic model better fit the experimental data, and the binding constants were determined by non-linear regression analyses. The net forward rate constant for the tightly bound complex formation was distinctively higher for surfaces functionalized with peptides (∼ 0.014 min - 1) when compared to surfaces functionalized with SCL (∼ 10 - 3 min - 1).

Original languageEnglish (US)
Pages (from-to)2200-2207
Number of pages8
JournalThin Solid Films
Volume520
Issue number6
DOIs
StatePublished - Jan 1 2012

Fingerprint

Spectroscopic ellipsometry
albumins
ellipsometry
Albumins
proteins
Proteins
Adsorption
Kinetics
adsorption
evaluation
kinetics
serums
Peptides
peptides
Ligands
ligands
Ellipsometry
Silicon
Serum Albumin
affinity

Keywords

  • Affinity surface
  • Albumin binding
  • Competitive protein adsorption
  • Ellipsometry
  • Peptides
  • Surface modification

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

Evaluation of the real-time protein adsorption kinetics on albumin-binding surfaces by dynamic in situ spectroscopic ellipsometry. / Guha Thakurta, Sanjukta; Viljoen, Hendrik J; Subramanian, Anuradha.

In: Thin Solid Films, Vol. 520, No. 6, 01.01.2012, p. 2200-2207.

Research output: Contribution to journalArticle

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