Epitaxial growth and magnetic properties of Cr-doped AlN thin films

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

Cr-doped AlN thin films were epitaxially grown on Al2O 3(001) substrates at low temperature by reactive magnetron sputtering, and their magnetic properties were investigated. Extensive x-ray diffraction studies indicated that the films have a wurtzite-type hexagonal structure and are (001) oriented, with an epitaxial relationship of the [100] direction of the films along the [110] direction of Al2O 3. The c axis lattice parameter of the films showed a linear dependence on the Cr concentration for Cr concentrations below 0.15. Room temperature ferromagnetism was observed, and the magnetic properties showed strong dependence on the Cr concentration over a wide range.

Original languageEnglish (US)
Pages (from-to)3137-3142
Number of pages6
JournalJournal of Physics Condensed Matter
Volume17
Issue number21
DOIs
StatePublished - Jun 1 2005

Fingerprint

Epitaxial growth
Magnetic properties
magnetic properties
Thin films
thin films
Ferromagnetism
Reactive sputtering
wurtzite
Magnetron sputtering
ferromagnetism
Lattice constants
lattice parameters
magnetron sputtering
x ray diffraction
Diffraction
X rays
Temperature
room temperature
Substrates
Direction compound

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Epitaxial growth and magnetic properties of Cr-doped AlN thin films. / Zhang, Jun; Liou, Sy-Hwang; Sellmyer, David J.

In: Journal of Physics Condensed Matter, Vol. 17, No. 21, 01.06.2005, p. 3137-3142.

Research output: Contribution to journalArticle

@article{74e44b9c3ae142fb9d87ca8e02773771,
title = "Epitaxial growth and magnetic properties of Cr-doped AlN thin films",
abstract = "Cr-doped AlN thin films were epitaxially grown on Al2O 3(001) substrates at low temperature by reactive magnetron sputtering, and their magnetic properties were investigated. Extensive x-ray diffraction studies indicated that the films have a wurtzite-type hexagonal structure and are (001) oriented, with an epitaxial relationship of the [100] direction of the films along the [110] direction of Al2O 3. The c axis lattice parameter of the films showed a linear dependence on the Cr concentration for Cr concentrations below 0.15. Room temperature ferromagnetism was observed, and the magnetic properties showed strong dependence on the Cr concentration over a wide range.",
author = "Jun Zhang and Sy-Hwang Liou and Sellmyer, {David J}",
year = "2005",
month = "6",
day = "1",
doi = "10.1088/0953-8984/17/21/009",
language = "English (US)",
volume = "17",
pages = "3137--3142",
journal = "Journal of Physics Condensed Matter",
issn = "0953-8984",
publisher = "IOP Publishing Ltd.",
number = "21",

}

TY - JOUR

T1 - Epitaxial growth and magnetic properties of Cr-doped AlN thin films

AU - Zhang, Jun

AU - Liou, Sy-Hwang

AU - Sellmyer, David J

PY - 2005/6/1

Y1 - 2005/6/1

N2 - Cr-doped AlN thin films were epitaxially grown on Al2O 3(001) substrates at low temperature by reactive magnetron sputtering, and their magnetic properties were investigated. Extensive x-ray diffraction studies indicated that the films have a wurtzite-type hexagonal structure and are (001) oriented, with an epitaxial relationship of the [100] direction of the films along the [110] direction of Al2O 3. The c axis lattice parameter of the films showed a linear dependence on the Cr concentration for Cr concentrations below 0.15. Room temperature ferromagnetism was observed, and the magnetic properties showed strong dependence on the Cr concentration over a wide range.

AB - Cr-doped AlN thin films were epitaxially grown on Al2O 3(001) substrates at low temperature by reactive magnetron sputtering, and their magnetic properties were investigated. Extensive x-ray diffraction studies indicated that the films have a wurtzite-type hexagonal structure and are (001) oriented, with an epitaxial relationship of the [100] direction of the films along the [110] direction of Al2O 3. The c axis lattice parameter of the films showed a linear dependence on the Cr concentration for Cr concentrations below 0.15. Room temperature ferromagnetism was observed, and the magnetic properties showed strong dependence on the Cr concentration over a wide range.

UR - http://www.scopus.com/inward/record.url?scp=18744367514&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=18744367514&partnerID=8YFLogxK

U2 - 10.1088/0953-8984/17/21/009

DO - 10.1088/0953-8984/17/21/009

M3 - Article

AN - SCOPUS:18744367514

VL - 17

SP - 3137

EP - 3142

JO - Journal of Physics Condensed Matter

JF - Journal of Physics Condensed Matter

SN - 0953-8984

IS - 21

ER -