Enhanced magneto-optic Kerr effects in thin magnetic/metallic layered structures

William A. McGahan, Liang Yao Chen, Z. S. Shan, D. J. Sellmyer, John A. Woollam

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

Enhanced Kerr rotation spectra are measured in thin magnetic layers on silver. Also, variable angle of incidence spectroscopic ellipsometry is employed to measure the optical dielectric function of both the thin magnetic layer and the underlying thick silver layer. These results are explained quantitatively using the electromagnetic theory for reflection of light from multiple layers of isotropic and gyrotropic materials.

Original languageEnglish (US)
Pages (from-to)2479-2481
Number of pages3
JournalApplied Physics Letters
Volume55
Issue number24
DOIs
StatePublished - Dec 1 1989

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magneto-optics
Kerr effects
silver
ellipsometry
incidence
electromagnetism

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Enhanced magneto-optic Kerr effects in thin magnetic/metallic layered structures. / McGahan, William A.; Chen, Liang Yao; Shan, Z. S.; Sellmyer, D. J.; Woollam, John A.

In: Applied Physics Letters, Vol. 55, No. 24, 01.12.1989, p. 2479-2481.

Research output: Contribution to journalArticle

McGahan, William A. ; Chen, Liang Yao ; Shan, Z. S. ; Sellmyer, D. J. ; Woollam, John A. / Enhanced magneto-optic Kerr effects in thin magnetic/metallic layered structures. In: Applied Physics Letters. 1989 ; Vol. 55, No. 24. pp. 2479-2481.
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