Ellipsometric measurement of the optical properties and electrical conductivity of indium tin oxide Thin Films

John A. Woollam, William A. Mcgahan, Blaine D. Johs

Research output: Contribution to journalConference article

7 Citations (Scopus)

Abstract

Films of indium tin oxide (ITO) are ubiquitous in display applications as they combine optical transparency and good electrical conductivity. Thin ITO films are often difficult to characterize optically as they are often inhomogeneous and have complicated optical absorption spectra. In this work, we have used variable angle of incidence spectroscopic ellipsometry (VASE) to gauge the thickness, grading, and surface roughness of ITO films ranging from a few tens of nm to hundreds of nm thick on glass substrates. A two Lorentz oscillator model is used, with one oscillator representing the interband absorption in the UV end of the spectrum, and the second oscillator modeling the Drude-like free carrier absorption in the infrared. The Drude parameters obtained from the analysis of the films can be used to estimate the electrical (D. C.) conductivity of the film from the simple Drude model for free carriers. We present results for several films from 7 to 40 nm thick, and compare the nominal electrical resistivity of these films to the resistivity derived from the VASE measurements.

Original languageEnglish (US)
Pages (from-to)962-968
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume2253
DOIs
StatePublished - Nov 4 1994
EventOptical Interference Coatings 1994 - Grenoble, France
Duration: Jun 5 1994Jun 10 1994

Fingerprint

Electrical Conductivity
Tin oxides
indium oxides
Optical Properties
Indium
tin oxides
Oxide films
Oxides
Thin Films
Optical properties
optical properties
Thin films
conductivity
electrical resistivity
thin films
Spectroscopic ellipsometry
oscillators
Spectroscopic Ellipsometry
ellipsometry
oxide films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Ellipsometric measurement of the optical properties and electrical conductivity of indium tin oxide Thin Films. / Woollam, John A.; Mcgahan, William A.; Johs, Blaine D.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 2253, 04.11.1994, p. 962-968.

Research output: Contribution to journalConference article

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