Electromagnetic calculations of the near field of a tip under polarized laser irradiation

Yong Feng Lu, Zhi Hong Mai, Wai Kin Chim

Research output: Contribution to journalArticle

28 Citations (Scopus)

Abstract

A general model of the near field emission for a tip under polarized laser irradiation is established for the case of imaging and processing by a laser-assisted scanning probe microscope (SPM). The near field emission of an actual SPM tip was calculated using the method of moment. The tip-sample geometry was modelled as a cone approaching a surface at the tip apex. Laser-induced current modes in the tip and sample were established in the form of trigonometric functions. This model can be used for rigorous calculations and has been applied to investigate the dependence of the near field on laser wavelength, tip aspect ratios, tip-sample distance and the dielectric properties of both tip and sample.

Original languageEnglish (US)
Pages (from-to)5910-5915
Number of pages6
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume38
Issue number10
StatePublished - Oct 1 1999

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Laser beam effects
near fields
electromagnetism
Field emission
irradiation
Lasers
Microscopes
lasers
Scanning
Induced currents
Laser modes
Method of moments
Dielectric properties
Cones
Aspect ratio
Imaging techniques
field emission
Wavelength
Geometry
microscopes

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Electromagnetic calculations of the near field of a tip under polarized laser irradiation. / Lu, Yong Feng; Mai, Zhi Hong; Chim, Wai Kin.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 38, No. 10, 01.10.1999, p. 5910-5915.

Research output: Contribution to journalArticle

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