Effects of magnetic field and temperature on the critical current hysteresis in tl-ca-ba-cu-o thin films

Hung Lun Chang, Jenh Yih Juang, Sy-Hwang Liou, Tzeng Ming Uen, Yih Shun Gou

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The behavior of the critical current density of Tl-Ca-Ba-Cu-O superconducting thin films in a cycling magnetic field was investigated. The hysteresis of the transport Jcmanifested similar features to those found in polycrystalline Y-Ba-Cu-O and granular Nb, Al thin films in zero-field cooling. However, a novel result of the transport Jcin field-cooled samples has been observed. The results were attributed to the presence of a saturated trapped magnetic flux in the weak-link network. The effects of temperature on both the trapped flux and the transport Jcsuggest the existence of various states of the trapped flux in the Tl-based superconducting thin films.

Original languageEnglish (US)
Pages (from-to)2037-2040
Number of pages4
JournalJapanese Journal of Applied Physics
Volume29
Issue number11
DOIs
StatePublished - Nov 1990

Fingerprint

Superconducting films
Critical currents
Hysteresis
critical current
hysteresis
Magnetic fields
Fluxes
Thin films
Magnetic flux
thin films
magnetic fields
Cooling
Temperature
temperature
magnetic flux
current density
cooling
cycles

Keywords

  • Critical current
  • Flux trapping
  • Hysteresis
  • Tl-Ca-Ba-Cu-O thin films

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Effects of magnetic field and temperature on the critical current hysteresis in tl-ca-ba-cu-o thin films. / Chang, Hung Lun; Juang, Jenh Yih; Liou, Sy-Hwang; Uen, Tzeng Ming; Gou, Yih Shun.

In: Japanese Journal of Applied Physics, Vol. 29, No. 11, 11.1990, p. 2037-2040.

Research output: Contribution to journalArticle

Chang, Hung Lun ; Juang, Jenh Yih ; Liou, Sy-Hwang ; Uen, Tzeng Ming ; Gou, Yih Shun. / Effects of magnetic field and temperature on the critical current hysteresis in tl-ca-ba-cu-o thin films. In: Japanese Journal of Applied Physics. 1990 ; Vol. 29, No. 11. pp. 2037-2040.
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