Effect of surface-influenced order on thermal expansivity of polymer thin films

C. Thompson, R. F. Saraf, J. L. Jordan-Sweet

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

Variations of the thermal expansion coefficient of thin polyimide films as a function of film thickness (40-260 nm) have been measured by monitoring film thickness as a function of temperature using X-ray reflectivity from samples of poly(pyromellitic dianhydride oxydianiline) (PMDA-ODA) films spin-cast onto silicon wafers. The effective expansion coefficient of the film decreases with decreasing thickness and is consistent with a bilayer model in which an interfacial region of constant thickness is formed for each film. The expansion coefficient of this surface or interfacial region is less than one-third the coefficient of the interior of the films. A simple method is described whereby the thermal expansion coefficient may be determined by reflectivity.

Original languageEnglish (US)
Pages (from-to)7135-7140
Number of pages6
JournalLangmuir
Volume13
Issue number26
StatePublished - Dec 24 1997

Fingerprint

Polymer films
Thin films
polymers
coefficients
thin films
Thermal expansion
Film thickness
thermal expansion
film thickness
reflectance
expansion
Silicon wafers
polyimides
Polyimides
casts
Hot Temperature
wafers
X rays
Monitoring
silicon

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Spectroscopy
  • Electrochemistry

Cite this

Effect of surface-influenced order on thermal expansivity of polymer thin films. / Thompson, C.; Saraf, R. F.; Jordan-Sweet, J. L.

In: Langmuir, Vol. 13, No. 26, 24.12.1997, p. 7135-7140.

Research output: Contribution to journalArticle

Thompson, C, Saraf, RF & Jordan-Sweet, JL 1997, 'Effect of surface-influenced order on thermal expansivity of polymer thin films', Langmuir, vol. 13, no. 26, pp. 7135-7140.
Thompson, C. ; Saraf, R. F. ; Jordan-Sweet, J. L. / Effect of surface-influenced order on thermal expansivity of polymer thin films. In: Langmuir. 1997 ; Vol. 13, No. 26. pp. 7135-7140.
@article{fd89810d6e4c494e91653e53665c35ac,
title = "Effect of surface-influenced order on thermal expansivity of polymer thin films",
abstract = "Variations of the thermal expansion coefficient of thin polyimide films as a function of film thickness (40-260 nm) have been measured by monitoring film thickness as a function of temperature using X-ray reflectivity from samples of poly(pyromellitic dianhydride oxydianiline) (PMDA-ODA) films spin-cast onto silicon wafers. The effective expansion coefficient of the film decreases with decreasing thickness and is consistent with a bilayer model in which an interfacial region of constant thickness is formed for each film. The expansion coefficient of this surface or interfacial region is less than one-third the coefficient of the interior of the films. A simple method is described whereby the thermal expansion coefficient may be determined by reflectivity.",
author = "C. Thompson and Saraf, {R. F.} and Jordan-Sweet, {J. L.}",
year = "1997",
month = "12",
day = "24",
language = "English (US)",
volume = "13",
pages = "7135--7140",
journal = "Langmuir",
issn = "0743-7463",
publisher = "American Chemical Society",
number = "26",

}

TY - JOUR

T1 - Effect of surface-influenced order on thermal expansivity of polymer thin films

AU - Thompson, C.

AU - Saraf, R. F.

AU - Jordan-Sweet, J. L.

PY - 1997/12/24

Y1 - 1997/12/24

N2 - Variations of the thermal expansion coefficient of thin polyimide films as a function of film thickness (40-260 nm) have been measured by monitoring film thickness as a function of temperature using X-ray reflectivity from samples of poly(pyromellitic dianhydride oxydianiline) (PMDA-ODA) films spin-cast onto silicon wafers. The effective expansion coefficient of the film decreases with decreasing thickness and is consistent with a bilayer model in which an interfacial region of constant thickness is formed for each film. The expansion coefficient of this surface or interfacial region is less than one-third the coefficient of the interior of the films. A simple method is described whereby the thermal expansion coefficient may be determined by reflectivity.

AB - Variations of the thermal expansion coefficient of thin polyimide films as a function of film thickness (40-260 nm) have been measured by monitoring film thickness as a function of temperature using X-ray reflectivity from samples of poly(pyromellitic dianhydride oxydianiline) (PMDA-ODA) films spin-cast onto silicon wafers. The effective expansion coefficient of the film decreases with decreasing thickness and is consistent with a bilayer model in which an interfacial region of constant thickness is formed for each film. The expansion coefficient of this surface or interfacial region is less than one-third the coefficient of the interior of the films. A simple method is described whereby the thermal expansion coefficient may be determined by reflectivity.

UR - http://www.scopus.com/inward/record.url?scp=0031374240&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031374240&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0031374240

VL - 13

SP - 7135

EP - 7140

JO - Langmuir

JF - Langmuir

SN - 0743-7463

IS - 26

ER -