Early error detection in industrial strength cache coherence protocols using SQL

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

A table-driven approach for designing industrial strength cache coherence protocols based on relational database technology is described. Protocols are specified using several interacting multi-input, multi-output controller state machines represented as database tables. Protocol scenarios specified using SQL constraints are solved to automatically generate database tables, and to statically check protocol properties including absence of deadlocks and other protocol invariants. The debugged tables are mapped to hardware using SQL operations while preserving protocol properties. The approach is deployed at Fujitsu System Technology Division in the design of their next generation multiprocessor and has discovered several errors early in the design cycle.

Original languageEnglish (US)
Title of host publicationProceedings - International Parallel and Distributed Processing Symposium, IPDPS 2003
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)0769519261, 9780769519265
DOIs
Publication statusPublished - Jan 1 2003
EventInternational Parallel and Distributed Processing Symposium, IPDPS 2003 - Nice, France
Duration: Apr 22 2003Apr 26 2003

Publication series

NameProceedings - International Parallel and Distributed Processing Symposium, IPDPS 2003

Other

OtherInternational Parallel and Distributed Processing Symposium, IPDPS 2003
CountryFrance
CityNice
Period4/22/034/26/03

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ASJC Scopus subject areas

  • Computational Theory and Mathematics
  • Theoretical Computer Science
  • Software

Cite this

Subramaniam, M. (2003). Early error detection in industrial strength cache coherence protocols using SQL. In Proceedings - International Parallel and Distributed Processing Symposium, IPDPS 2003 [1213518] (Proceedings - International Parallel and Distributed Processing Symposium, IPDPS 2003). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IPDPS.2003.1213518