Drive-level dependence of doubly rotated langasite resonators with different configurations

Haifeng Zhang, John Kosinski, Yuan Xie, Joseph A Turner

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The miniaturization of crystal resonators and filters toward the micro electromechanical systems (MEMS) and nano-structured scales demands improvement of nonlinear piezoelectricity theory and a better understanding of the nonlinear behavior of new crystal materials. The nonlinearities affect the quality factor and acoustic behavior of MEMS and nano-structured resonators and filters. Among these nonlinear effects, drive-level dependence (DLD), which describes the instability of the resonator frequency resulting from voltage level and/or power density, is a potentially significant problem for miniaturized resonators. Langasite, a promising new piezoelectric material, is of current interest for a variety of applications because of its good temperature behavior, good piezoelectric coupling, low acoustic loss, and high Q-factor. It has been recently used to make high-temperature MEMS. In this paper, we report experimental measurements of the DLD of langasite resonators with different resonator configurations (plano-plano, single bevel, and double bevel). The results show that the resonator configuration affects the DLD of the langasite resonator. The DLD measurement results for langasite are compared with literature values for quartz, langaniste, and langatate, and with additional new measurements for a GaPO4 resonator of type R-30 (¿11.1°rotated Y-cut). Uncertainty analysis for the measured drive-level sensitivity is performed as well.

Original languageEnglish (US)
Article number6512833
Pages (from-to)963-969
Number of pages7
JournalIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume60
Issue number5
DOIs
StatePublished - May 20 2013

Fingerprint

Resonators
resonators
configurations
MEMS
microelectromechanical systems
Q factors
Acoustics
Crystal filters
Crystal resonators
Piezoelectricity
Uncertainty analysis
filters
Piezoelectric materials
piezoelectricity
acoustics
miniaturization
Quartz
crystals
radiant flux density
quartz

ASJC Scopus subject areas

  • Instrumentation
  • Acoustics and Ultrasonics
  • Electrical and Electronic Engineering

Cite this

Drive-level dependence of doubly rotated langasite resonators with different configurations. / Zhang, Haifeng; Kosinski, John; Xie, Yuan; Turner, Joseph A.

In: IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, Vol. 60, No. 5, 6512833, 20.05.2013, p. 963-969.

Research output: Contribution to journalArticle

@article{2d00c4c4a4d54487856e1546e03f9700,
title = "Drive-level dependence of doubly rotated langasite resonators with different configurations",
abstract = "The miniaturization of crystal resonators and filters toward the micro electromechanical systems (MEMS) and nano-structured scales demands improvement of nonlinear piezoelectricity theory and a better understanding of the nonlinear behavior of new crystal materials. The nonlinearities affect the quality factor and acoustic behavior of MEMS and nano-structured resonators and filters. Among these nonlinear effects, drive-level dependence (DLD), which describes the instability of the resonator frequency resulting from voltage level and/or power density, is a potentially significant problem for miniaturized resonators. Langasite, a promising new piezoelectric material, is of current interest for a variety of applications because of its good temperature behavior, good piezoelectric coupling, low acoustic loss, and high Q-factor. It has been recently used to make high-temperature MEMS. In this paper, we report experimental measurements of the DLD of langasite resonators with different resonator configurations (plano-plano, single bevel, and double bevel). The results show that the resonator configuration affects the DLD of the langasite resonator. The DLD measurement results for langasite are compared with literature values for quartz, langaniste, and langatate, and with additional new measurements for a GaPO4 resonator of type R-30 (¿11.1°rotated Y-cut). Uncertainty analysis for the measured drive-level sensitivity is performed as well.",
author = "Haifeng Zhang and John Kosinski and Yuan Xie and Turner, {Joseph A}",
year = "2013",
month = "5",
day = "20",
doi = "10.1109/TUFFC.2013.2653",
language = "English (US)",
volume = "60",
pages = "963--969",
journal = "IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control",
issn = "0885-3010",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "5",

}

TY - JOUR

T1 - Drive-level dependence of doubly rotated langasite resonators with different configurations

AU - Zhang, Haifeng

AU - Kosinski, John

AU - Xie, Yuan

AU - Turner, Joseph A

PY - 2013/5/20

Y1 - 2013/5/20

N2 - The miniaturization of crystal resonators and filters toward the micro electromechanical systems (MEMS) and nano-structured scales demands improvement of nonlinear piezoelectricity theory and a better understanding of the nonlinear behavior of new crystal materials. The nonlinearities affect the quality factor and acoustic behavior of MEMS and nano-structured resonators and filters. Among these nonlinear effects, drive-level dependence (DLD), which describes the instability of the resonator frequency resulting from voltage level and/or power density, is a potentially significant problem for miniaturized resonators. Langasite, a promising new piezoelectric material, is of current interest for a variety of applications because of its good temperature behavior, good piezoelectric coupling, low acoustic loss, and high Q-factor. It has been recently used to make high-temperature MEMS. In this paper, we report experimental measurements of the DLD of langasite resonators with different resonator configurations (plano-plano, single bevel, and double bevel). The results show that the resonator configuration affects the DLD of the langasite resonator. The DLD measurement results for langasite are compared with literature values for quartz, langaniste, and langatate, and with additional new measurements for a GaPO4 resonator of type R-30 (¿11.1°rotated Y-cut). Uncertainty analysis for the measured drive-level sensitivity is performed as well.

AB - The miniaturization of crystal resonators and filters toward the micro electromechanical systems (MEMS) and nano-structured scales demands improvement of nonlinear piezoelectricity theory and a better understanding of the nonlinear behavior of new crystal materials. The nonlinearities affect the quality factor and acoustic behavior of MEMS and nano-structured resonators and filters. Among these nonlinear effects, drive-level dependence (DLD), which describes the instability of the resonator frequency resulting from voltage level and/or power density, is a potentially significant problem for miniaturized resonators. Langasite, a promising new piezoelectric material, is of current interest for a variety of applications because of its good temperature behavior, good piezoelectric coupling, low acoustic loss, and high Q-factor. It has been recently used to make high-temperature MEMS. In this paper, we report experimental measurements of the DLD of langasite resonators with different resonator configurations (plano-plano, single bevel, and double bevel). The results show that the resonator configuration affects the DLD of the langasite resonator. The DLD measurement results for langasite are compared with literature values for quartz, langaniste, and langatate, and with additional new measurements for a GaPO4 resonator of type R-30 (¿11.1°rotated Y-cut). Uncertainty analysis for the measured drive-level sensitivity is performed as well.

UR - http://www.scopus.com/inward/record.url?scp=84877756487&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84877756487&partnerID=8YFLogxK

U2 - 10.1109/TUFFC.2013.2653

DO - 10.1109/TUFFC.2013.2653

M3 - Article

VL - 60

SP - 963

EP - 969

JO - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

JF - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

SN - 0885-3010

IS - 5

M1 - 6512833

ER -