Detection of Organic Attachment onto Highly Ordered Three-Dimensional Nanostructure Thin Films by Generalized Ellipsometry and Quartz Crystal Microbalance with Dissipation Techniques

Keith B. Rodenhausen, Daniel Schmidt, Charles Rice, Tino Hofmann, Eva Schubert, Mathias Schubert

Research output: Chapter in Book/Report/Conference proceedingChapter

1 Scopus citations

Abstract

Highly ordered three-dimensional nanostructure thin films provide substantially increased surface area for organic attachment and new detection principles due to the new and unique optical and physical properties of the nanostructures. Upon organic material attachment, the optical birefringence of these highly ordered three-dimensional nanostructure thin films changes due to screening of polarization charges. The surfaces of the highly ordered three-dimensional nanostructure thin films are thus suitable candidates for studying organic adsorption for sensing and chromatography applications. We review contemporary research in this area and specifically report the monitoring of organic attachment using the generalized ellipsometry and quartz crystal microbalance with dissipation techniques. Both methods are sensitive to the adsorption of organic layers, on the order of few angstroms to few micrometers in thickness, at the solid-liquid interface. The combinatorial use of both techniques, described in Chap. 17, provides insight toward how organic materials attach within highly ordered three-dimensional nanostructure thin films. We discuss studies of fibronectin protein adsorption, decanethiol chemisorption, and cetyltrimethylammonium bromide adsorption. We also address potential future developments and applications.

Original languageEnglish (US)
Title of host publicationSpringer Series in Surface Sciences
PublisherSpringer Verlag
Pages225-245
Number of pages21
DOIs
Publication statusPublished - Jan 1 2018

Publication series

NameSpringer Series in Surface Sciences
Volume52
ISSN (Print)0931-5195

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ASJC Scopus subject areas

  • Surfaces, Coatings and Films

Cite this

Rodenhausen, K. B., Schmidt, D., Rice, C., Hofmann, T., Schubert, E., & Schubert, M. (2018). Detection of Organic Attachment onto Highly Ordered Three-Dimensional Nanostructure Thin Films by Generalized Ellipsometry and Quartz Crystal Microbalance with Dissipation Techniques. In Springer Series in Surface Sciences (pp. 225-245). (Springer Series in Surface Sciences; Vol. 52). Springer Verlag. https://doi.org/10.1007/978-3-319-75895-4_10