Current-voltage-temperature characteristics of DNA origami

Edson P. Bellido, Alfredo D. Bobadilla, Norma L. Rangel, Hong Zhong, Michael L. Norton, Alexander Sinitskii, Jorge M. Seminario

Research output: Contribution to journalArticle

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Abstract

The temperature dependences of the current-voltage characteristics of a sample of triangular DNA origami deposited in a 100nm gap between platinum electrodes are measured using a probe station. Below 240K, the sample shows high impedance, similar to that of the substrate. Near room temperature the current shows exponential behavior with respect to the inverse of temperature. Sweep times of 1s do not yield a steady state; however sweep times of 450s for the bias voltage secure a steady state. The thermionic emission and hopping conduction models yield similar barriers of ∼0.7eV at low voltages. For high voltages, the hopping conduction mechanism yields a barrier of 0.9eV and the thermionic emission yields 1.1eV. The experimental data set suggests that the dominant conduction mechanism is hopping in the range 280-320K. The results are consistent with theoretical and experimental estimates of the barrier for related molecules.

Original languageEnglish (US)
Article number175102
JournalNanotechnology
Volume20
Issue number17
DOIs
StatePublished - May 12 2009

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Thermionic emission
DNA
Electric potential
Current voltage characteristics
Bias voltage
Platinum
Temperature
Electrodes
Molecules
Substrates

ASJC Scopus subject areas

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering
  • Electrical and Electronic Engineering

Cite this

Bellido, E. P., Bobadilla, A. D., Rangel, N. L., Zhong, H., Norton, M. L., Sinitskii, A., & Seminario, J. M. (2009). Current-voltage-temperature characteristics of DNA origami. Nanotechnology, 20(17), [175102]. https://doi.org/10.1088/0957-4484/20/17/175102

Current-voltage-temperature characteristics of DNA origami. / Bellido, Edson P.; Bobadilla, Alfredo D.; Rangel, Norma L.; Zhong, Hong; Norton, Michael L.; Sinitskii, Alexander; Seminario, Jorge M.

In: Nanotechnology, Vol. 20, No. 17, 175102, 12.05.2009.

Research output: Contribution to journalArticle

Bellido, EP, Bobadilla, AD, Rangel, NL, Zhong, H, Norton, ML, Sinitskii, A & Seminario, JM 2009, 'Current-voltage-temperature characteristics of DNA origami', Nanotechnology, vol. 20, no. 17, 175102. https://doi.org/10.1088/0957-4484/20/17/175102
Bellido EP, Bobadilla AD, Rangel NL, Zhong H, Norton ML, Sinitskii A et al. Current-voltage-temperature characteristics of DNA origami. Nanotechnology. 2009 May 12;20(17). 175102. https://doi.org/10.1088/0957-4484/20/17/175102
Bellido, Edson P. ; Bobadilla, Alfredo D. ; Rangel, Norma L. ; Zhong, Hong ; Norton, Michael L. ; Sinitskii, Alexander ; Seminario, Jorge M. / Current-voltage-temperature characteristics of DNA origami. In: Nanotechnology. 2009 ; Vol. 20, No. 17.
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