CoPtCr:C nanocomposite films for high density recording

H. Zeng, M. L. Yan, Y. Liu, David J Sellmyer

Research output: Contribution to journalArticle

20 Citations (Scopus)

Abstract

We report results on the magnetic properties of nanocomposite films of the form (Co86Cr14)xPt1-x:C, which were prepared by magnetron sputtering and subsequent annealing. X-ray diffraction shows that these films consist of CoPtCr grains with the face-centered-tetragonal structure embedded in an amorphous C matrix. Magnetic properties such as coercivity (Hc), remanence ratio (S), and coercive squareness (S*) are strongly dependent on the Pt and C composition and annealing temperatures. Compared with previously reported CoPt:C films with a equiatomic Co and Pt ratio, lower exchange coupling and higher S and S* at the same C concentration were obtained. Hc values ranging from 2 to 10 kOe and S close to 1 were achieved for film thicknesses down to 10 nm. These features make CoPtCr:C nanocomposite films very attractive for next-generation high-density recording.

Original languageEnglish (US)
Pages (from-to)810-812
Number of pages3
JournalJournal of Applied Physics
Volume89
Issue number1
DOIs
StatePublished - Jan 1 2001

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nanocomposites
recording
magnetic properties
annealing
remanence
coercivity
magnetron sputtering
film thickness
matrices
diffraction
x rays
temperature

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

CoPtCr:C nanocomposite films for high density recording. / Zeng, H.; Yan, M. L.; Liu, Y.; Sellmyer, David J.

In: Journal of Applied Physics, Vol. 89, No. 1, 01.01.2001, p. 810-812.

Research output: Contribution to journalArticle

Zeng, H. ; Yan, M. L. ; Liu, Y. ; Sellmyer, David J. / CoPtCr:C nanocomposite films for high density recording. In: Journal of Applied Physics. 2001 ; Vol. 89, No. 1. pp. 810-812.
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