Controllable electrical breakdown of multiwall carbon nanotubes

Bo Song, Ning Xi, Zhiyong Sun, Ruiguo Yang, Liangliang Chen, Hongzhi Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

Controllable electrical breakdown of multiwall nanotubes (MWNTs) is studied utilizing the atomic force microscopy (AFM). Electrical breakdown has been known as the way to fundamentally understand the electrical properties of nanotubes and an approach to develop MWNT based transistors and sensors. Normally, electrical breakdown was known to be happened in the center of MWNT because of the thermal accumulation. However, considering the effect of thermal dissipation, the electrical breakdown could be mechanically controlled by an additional heat sink, which could be the substrate of MWNT device. Therefore, the electrical breakdown process is controllable through controlling Joule heating and thermal dissipation. In this research, we study the crucial factors that affect the electrical breakdown. The AFM based nano robot is used to measure the conductance distribution, and manipulate the three dimensional structure of MWNT in order to change the position of heat sink to control the location where electrical breakdown happened. The controllable electrical breakdown is an alternative approach for conducting bandgap engineering in nanodevice and fabricating high performance nano sensors and transistors.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE Conference on Nanotechnology
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages693-697
Number of pages5
ISBN (Electronic)9781479956227
DOIs
Publication statusPublished - Nov 26 2014
Event2014 14th IEEE International Conference on Nanotechnology, IEEE-NANO 2014 - Toronto, Canada
Duration: Aug 18 2014Aug 21 2014

Publication series

NameProceedings of the IEEE Conference on Nanotechnology
ISSN (Electronic)1944-9399

Other

Other2014 14th IEEE International Conference on Nanotechnology, IEEE-NANO 2014
CountryCanada
CityToronto
Period8/18/148/21/14

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Keywords

  • Atomic force microscopy
  • Carbon nanotube
  • Controllable electrical breakdown
  • Nanorobot

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Science Applications
  • Modeling and Simulation
  • Instrumentation

Cite this

Song, B., Xi, N., Sun, Z., Yang, R., Chen, L., & Chen, H. (2014). Controllable electrical breakdown of multiwall carbon nanotubes. In Proceedings of the IEEE Conference on Nanotechnology (pp. 693-697). [6968133] (Proceedings of the IEEE Conference on Nanotechnology). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NANO.2014.6968133