Contact-resonance atomic force microscopy for viscoelasticity

P. A. Yuya, D. C. Hurley, Joseph A Turner

Research output: Contribution to journalArticle

119 Citations (Scopus)

Abstract

We present a quantitative method for determining the viscoelastic properties of materials with nanometer spatial resolution. The approach is based on the atomic force acoustic microscopy technique that involves the resonant frequencies of the atomic force microscopy cantilever when its tip is in contact with a sample surface. We derive expressions for the viscoelastic properties of the sample in terms of the cantilever frequency response and damping loss. We demonstrate the approach by obtaining experimental values for the storage and loss moduli of a poly(methyl methacrylate) film using a polystyrene sample as a reference material. Experimental techniques and system calibration methods to perform material property measurements are also presented.

Original languageEnglish (US)
Article number074916
JournalJournal of Applied Physics
Volume104
Issue number7
DOIs
StatePublished - Oct 22 2008

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viscoelasticity
atomic force microscopy
polymethyl methacrylate
frequency response
resonant frequencies
polystyrene
spatial resolution
damping
microscopy
acoustics

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Contact-resonance atomic force microscopy for viscoelasticity. / Yuya, P. A.; Hurley, D. C.; Turner, Joseph A.

In: Journal of Applied Physics, Vol. 104, No. 7, 074916, 22.10.2008.

Research output: Contribution to journalArticle

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