Contact resonance AFM to quantify the in-plane and out-of-plane loss tangents of polymers simultaneously

E. Rezaei, J. A. Turner

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Contact resonance atomic force microscope (AFM) methods are used to quantify the elastic and viscoelastic properties of numerous materials including polymers. More recently, U-shaped AFM thermalevers have been developed to allow the local heating of samples, and the resonances of these probes are much more complex. These probes also allow the in-plane and out-of-plane tip-sample motion to be excited independently at the same location using a Lorentz force excitation. Here, such a probe is used to determine the in-plane and out-of-plane viscoelastic properties at the same location. The approach is demonstrated with respect to the indentation and shear loss tangents on high-density polyethylene and polystyrene.

Original languageEnglish (US)
Article number101902
JournalApplied Physics Letters
Volume110
Issue number10
DOIs
StatePublished - Mar 6 2017

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tangents
microscopes
probes
polymers
Lorentz force
indentation
polyethylenes
polystyrene
elastic properties
shear
heating
excitation

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Contact resonance AFM to quantify the in-plane and out-of-plane loss tangents of polymers simultaneously. / Rezaei, E.; Turner, J. A.

In: Applied Physics Letters, Vol. 110, No. 10, 101902, 06.03.2017.

Research output: Contribution to journalArticle

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