Comparison of magnetic images using point and thin-film magnetic force microscopy tips

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

The magnetic images of a magnetic reference sample were compared using point and thin-film magnetic force microscopy (MFM) tips. The thin film MPM tip was made by magnetron sputtering of an amorphous metal. The point MFM tip was made by an ion muling process that produces a small magnetic particle on the cantilever. Our results clearly demonstrated that the volume of magnetic material involved in the tip-sample interaction is much reduced in the case of the point tip than in that of the thin film tips. By comparing the magnetic images of a tri-bit pattern on a magnetic reference sample, we observed an improved resolution using a point MFM tip.

Original languageEnglish (US)
Pages (from-to)3989-3991
Number of pages3
JournalIEEE Transactions on Magnetics
Volume35
Issue number5 PART 2
DOIs
StatePublished - Jan 1 1999

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Magnetic force microscopy
magnetic force microscopy
Thin films
thin films
Magnetic materials
Magnetron sputtering
Metals
Ions
magnetic materials
magnetron sputtering

Keywords

  • Magnetic force microscopy
  • Magnetic force microscopy tip
  • Magnetic images of recording disks
  • Resolution of magnetic images

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Comparison of magnetic images using point and thin-film magnetic force microscopy tips. / Liou, Sy-Hwang.

In: IEEE Transactions on Magnetics, Vol. 35, No. 5 PART 2, 01.01.1999, p. 3989-3991.

Research output: Contribution to journalArticle

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