Characterization of UV irradiated space application polymers by spectroscopic ellipsometry

Corey L. Bungay, Thomas E. Tiwald, Michael J. Devries, Brad J. Dworak, John A Woollam

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Materials deployed on long-duration space missions such as the Hubble Space Telescope (HST) and the proposed International Space Station (ISS) are subject to high ultraviolet (UV) radiation fluences. Some UV radiation present in space has photon energy high enough to dissociate organic polymer molecular bonds. Induced chemical structure modifications can cause changes in optical, structural, and thermal properties. The present work investigates UV radiation effects on DuPont Kapton H polyimide, polyarylene ether benzimidazole (PAEBI), and DuPont Teflon fluorinated ethylene-propylene (FEP). UV irradiated polymers were characterized with in situ and ex situ spectroscopic ellipsometry (SE). Ellipsometric data acquired on UV modified polymers were best modeled as an exponentially graded layer, as opposed to a single layer or linearly graded layer model. Because photon intensity decays exponentially as a function of depth into absorbing materials, an exponentially graded model should be the most physically realistic. Ellipsometric data provided information about changes in UV absorption spectra, depth of damage, and growth trends in the damaged layer.

Original languageEnglish (US)
Pages (from-to)300-309
Number of pages10
JournalPolymer Engineering and Science
Volume40
Issue number2
DOIs
StatePublished - Jan 1 2000

Fingerprint

Spectroscopic ellipsometry
Space applications
Ultraviolet radiation
Polymers
Photons
Space telescopes
Organic polymers
Radiation effects
Polytetrafluoroethylene
Space stations
Polytetrafluoroethylenes
Polyimides
Ether
Propylene
Structural properties
Absorption spectra
Ethers
Ethylene
Thermodynamic properties
Optical properties

ASJC Scopus subject areas

  • Chemistry(all)
  • Polymers and Plastics
  • Materials Chemistry

Cite this

Characterization of UV irradiated space application polymers by spectroscopic ellipsometry. / Bungay, Corey L.; Tiwald, Thomas E.; Devries, Michael J.; Dworak, Brad J.; Woollam, John A.

In: Polymer Engineering and Science, Vol. 40, No. 2, 01.01.2000, p. 300-309.

Research output: Contribution to journalArticle

Bungay, Corey L. ; Tiwald, Thomas E. ; Devries, Michael J. ; Dworak, Brad J. ; Woollam, John A. / Characterization of UV irradiated space application polymers by spectroscopic ellipsometry. In: Polymer Engineering and Science. 2000 ; Vol. 40, No. 2. pp. 300-309.
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