Characterization of Component Films in Multilayer Magneto-Optic Structures

William A. McGahan, Ping He, Liang Yao Chen, John A. Woollam

Research output: Contribution to journalArticle

Abstract

We have developed a procedure involving normal angle of incidence Kerr spectroscopy, variable angle of incidence spectroscopic ellipsometry, and variable angle of incidence spectroscopic magnetooptic ellipsometry by which it is possible to extract layer thicknesses and optical and magneto-optical constants from individual layers within multilayered structures. The procedure is nondestructive, and we have successfully applied it to several materials systems, one of which is presented here. Additionally, we discuss the advantages and disadvantages of this procedure as a means of studying component layers in multilayer films.

Original languageEnglish (US)
Pages (from-to)1346-1348
Number of pages3
JournalIEEE Transactions on Magnetics
Volume26
Issue number5
DOIs
StatePublished - Sep 1990

Fingerprint

Magnetooptical effects
Optical constants
Spectroscopic ellipsometry
Multilayer films
Ellipsometry
Multilayers
Spectroscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Characterization of Component Films in Multilayer Magneto-Optic Structures. / McGahan, William A.; He, Ping; Chen, Liang Yao; Woollam, John A.

In: IEEE Transactions on Magnetics, Vol. 26, No. 5, 09.1990, p. 1346-1348.

Research output: Contribution to journalArticle

McGahan, William A. ; He, Ping ; Chen, Liang Yao ; Woollam, John A. / Characterization of Component Films in Multilayer Magneto-Optic Structures. In: IEEE Transactions on Magnetics. 1990 ; Vol. 26, No. 5. pp. 1346-1348.
@article{0381e6c3d9204579ae90b1dfe7f05885,
title = "Characterization of Component Films in Multilayer Magneto-Optic Structures",
abstract = "We have developed a procedure involving normal angle of incidence Kerr spectroscopy, variable angle of incidence spectroscopic ellipsometry, and variable angle of incidence spectroscopic magnetooptic ellipsometry by which it is possible to extract layer thicknesses and optical and magneto-optical constants from individual layers within multilayered structures. The procedure is nondestructive, and we have successfully applied it to several materials systems, one of which is presented here. Additionally, we discuss the advantages and disadvantages of this procedure as a means of studying component layers in multilayer films.",
author = "McGahan, {William A.} and Ping He and Chen, {Liang Yao} and Woollam, {John A.}",
year = "1990",
month = "9",
doi = "10.1109/20.104370",
language = "English (US)",
volume = "26",
pages = "1346--1348",
journal = "IEEE Transactions on Magnetics",
issn = "0018-9464",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "5",

}

TY - JOUR

T1 - Characterization of Component Films in Multilayer Magneto-Optic Structures

AU - McGahan, William A.

AU - He, Ping

AU - Chen, Liang Yao

AU - Woollam, John A.

PY - 1990/9

Y1 - 1990/9

N2 - We have developed a procedure involving normal angle of incidence Kerr spectroscopy, variable angle of incidence spectroscopic ellipsometry, and variable angle of incidence spectroscopic magnetooptic ellipsometry by which it is possible to extract layer thicknesses and optical and magneto-optical constants from individual layers within multilayered structures. The procedure is nondestructive, and we have successfully applied it to several materials systems, one of which is presented here. Additionally, we discuss the advantages and disadvantages of this procedure as a means of studying component layers in multilayer films.

AB - We have developed a procedure involving normal angle of incidence Kerr spectroscopy, variable angle of incidence spectroscopic ellipsometry, and variable angle of incidence spectroscopic magnetooptic ellipsometry by which it is possible to extract layer thicknesses and optical and magneto-optical constants from individual layers within multilayered structures. The procedure is nondestructive, and we have successfully applied it to several materials systems, one of which is presented here. Additionally, we discuss the advantages and disadvantages of this procedure as a means of studying component layers in multilayer films.

UR - http://www.scopus.com/inward/record.url?scp=0025491373&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0025491373&partnerID=8YFLogxK

U2 - 10.1109/20.104370

DO - 10.1109/20.104370

M3 - Article

AN - SCOPUS:0025491373

VL - 26

SP - 1346

EP - 1348

JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

SN - 0018-9464

IS - 5

ER -