Carrier redistribution in organic/inorganic (poly(3,4-ethylenedioxy thiophene/poly(styrenesulfonate)polymer)-Si) heterojunction determined from infrared ellipsometry

M. Schubert, C. Bundesmann, H. V. Wenckstern, G. Jakopic, A. Haase, N. K. Persson, F. Zhang, H. Arwin, O. Inganäs

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Abstract

Infrared spectroscopic ellipsometry analysis of poly(3,4-ethylenedioxy thiophene) (PEDOT)/poly(styrenesulfonate) (PSS) polymer layers on p- and n-Si was performed. The classical Drude optical conductivity model was applied to obtain the optical conductivity parameters. Charge-carrier redistribution phenomena were observed within layers of few nanometer thickness at the organic-inorganic interface. The results demonstrated the use of infrared ellipsometry for polymer thin-layer analysis.

Original languageEnglish (US)
Pages (from-to)1311-1313
Number of pages3
JournalApplied Physics Letters
Volume84
Issue number8
DOIs
Publication statusPublished - Feb 23 2004

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ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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