Calibration of atomic force microscope cantilevers using piezolevers

Saltuk B. Aksu, Joseph A. Turner

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

The atomic force microscope (AFM) can provide qualitative information by numerous imaging modes, but it can also provide quantitative information when calibrated cantilevers are used. In this article a new technique is demonstrated to calibrate AFM cantilevers using a reference piezolever. Experiments are performed on 13 different commercially available cantilevers. The stiff cantilevers, whose stiffness is more than 0.4 N/m, are compared to the stiffness values measured using nanoindentation. The experimental data collected by the piezolever method is in good agreement with the nanoindentation data. Calibration with a piezolever is fast, easy, and nondestructive and a commercially available AFM is enough to perform the experiments. In addition, the AFM laser must not be calibrated. Calibration is reported here for cantilevers whose stiffness lies between 0.08 and 6.02 N/m.

Original languageEnglish (US)
Article number043704
JournalReview of Scientific Instruments
Volume78
Issue number4
DOIs
StatePublished - May 8 2007

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Microscopes
microscopes
Calibration
stiffness
Stiffness
Nanoindentation
nanoindentation
Experiments
Imaging techniques
Lasers
lasers

ASJC Scopus subject areas

  • Instrumentation

Cite this

Calibration of atomic force microscope cantilevers using piezolevers. / Aksu, Saltuk B.; Turner, Joseph A.

In: Review of Scientific Instruments, Vol. 78, No. 4, 043704, 08.05.2007.

Research output: Contribution to journalArticle

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