Birefringence and reflectivity of single-crystal by generalized ellipsometry

J. Hecht, A. Eifler, V. Riede, M. Schubert

Research output: Contribution to journalArticle

39 Citations (Scopus)

Abstract

Transmission and reflection generalized variable-angle spectroscopic ellipsometry and polarized transmission intensity measurements over the photon energy range from 0.74 to 5.0 eV have been used to characterize the optical properties of the ordered-vacancy compound (Formula presented) We report the dispersion of the uniaxial refractive index below the band gap. The onset of weak absorption indicates the fundamental band edge at about 2.95 eV, but does not reveal the nature of the lowest band-to-band transition. Above the fundamental band gap we assign four possible critical-point structures from a line-shape analysis of the sample dielectric function.

Original languageEnglish (US)
Pages (from-to)7037-7042
Number of pages6
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume57
Issue number12
DOIs
StatePublished - Jan 1 1998

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Ellipsometry
Birefringence
ellipsometry
birefringence
Energy gap
Single crystals
reflectance
Spectroscopic ellipsometry
Wave transmission
single crystals
Electron transitions
Vacancies
Refractive index
Photons
Optical properties
line shape
critical point
refractivity
optical properties
photons

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Birefringence and reflectivity of single-crystal by generalized ellipsometry. / Hecht, J.; Eifler, A.; Riede, V.; Schubert, M.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 57, No. 12, 01.01.1998, p. 7037-7042.

Research output: Contribution to journalArticle

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