Atomic oxygen effects on thin film space coatings studied by spectroscopic ellipsometry, atomic force microscopy, and laser light scattering

R. A. Synowicki, Jeffrey S. Hale, John A. Woollam

Research output: Contribution to conferencePaper

Abstract

The University of Nebraska is currently evaluating Low Earth Orbit (LEO) simulation techniques as well as a variety of thin film protective coatings to withstand atomic oxygen (AO) degradation. Both oxygen plasma ashers and an electron cyclotron resonance (ECR) source are being used for LEO simulation. Thin film coatings are characterized by optical techniques including Variable Angle Spectroscopic Ellipsometry, Optical spectrophotometry, and laser light scatterometry. Atomic Force Microscopy (AFM) is also used to characterize surface morphology. Results on diamondlike carbon (DLC) films show that DLC degrades with simulated AO exposure at a rate comparable to Kapton polyimide. Since DLC is not as susceptible to environmental factors such as moisture absorption, it could potentially provide more accurate measurements of AO fluence on short space flights.

Original languageEnglish (US)
Pages119-123
Number of pages5
Publication statusPublished - Jan 1 1992
EventMaterials Specialist Conference - Coating Technology for Aerospace Systems, 1992 - Dallas, United States
Duration: Apr 16 1992Apr 17 1992

Other

OtherMaterials Specialist Conference - Coating Technology for Aerospace Systems, 1992
CountryUnited States
CityDallas
Period4/16/924/17/92

    Fingerprint

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Synowicki, R. A., Hale, J. S., & Woollam, J. A. (1992). Atomic oxygen effects on thin film space coatings studied by spectroscopic ellipsometry, atomic force microscopy, and laser light scattering. 119-123. Paper presented at Materials Specialist Conference - Coating Technology for Aerospace Systems, 1992, Dallas, United States.