Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN

V. Darakchieva, T. Paskova, P. P. Paskov, H. Arwin, M. Schubert, B. Monemar, S. Figge, D. Homme, B. A. Haskell, P. T. Fini, S. Nakamura

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Generalized infrared spectroscopic ellipsometry was applied to study the vibrational properties of anisotropically strained a-plane GaN films with different thicknesses. We have established a correlation between the phonon mode parameters and the strain, which allows the determination of the deformation potentials and strain-free frequency of the GaN A 1(TO) mode. These results are compared with previous theoretical and experimental findings and discussed.

Original languageEnglish (US)
Pages (from-to)1594-1598
Number of pages5
JournalPhysica Status Solidi (B) Basic Research
Volume243
Issue number7
DOIs
StatePublished - Jun 1 2006

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Spectroscopic ellipsometry
ellipsometry
Infrared radiation

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN. / Darakchieva, V.; Paskova, T.; Paskov, P. P.; Arwin, H.; Schubert, M.; Monemar, B.; Figge, S.; Homme, D.; Haskell, B. A.; Fini, P. T.; Nakamura, S.

In: Physica Status Solidi (B) Basic Research, Vol. 243, No. 7, 01.06.2006, p. 1594-1598.

Research output: Contribution to journalArticle

Darakchieva, V, Paskova, T, Paskov, PP, Arwin, H, Schubert, M, Monemar, B, Figge, S, Homme, D, Haskell, BA, Fini, PT & Nakamura, S 2006, 'Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN', Physica Status Solidi (B) Basic Research, vol. 243, no. 7, pp. 1594-1598. https://doi.org/10.1002/pssb.200565400
Darakchieva, V. ; Paskova, T. ; Paskov, P. P. ; Arwin, H. ; Schubert, M. ; Monemar, B. ; Figge, S. ; Homme, D. ; Haskell, B. A. ; Fini, P. T. ; Nakamura, S. / Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN. In: Physica Status Solidi (B) Basic Research. 2006 ; Vol. 243, No. 7. pp. 1594-1598.
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