Anisotropy and magneto-optical properties of sputtered Co/Ni multilayer thin films

Y. B. Zhang, J. A. Woollam, J. X. Shen, D. J. Sellmyer

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Several series of sputtered Co/Ni multilayer thin films have been investigated. The volume and interface contributions to the magnetic anisotropy were determined from magnetization measurements, and the interface anisotropy, Ki = 0.23 ± 0.03 erg/cm2, was found to support perpendicular magnetic anisotropy. The anisotropy constant, K, increased with the Au buffer layer thickness, indicating the buffer layer was crucial to the perpendicular magnetic anisotropy. The polar Kerr rotation and coercivity as a function of temperature, and room temperature magneto-optical figure of merit are presented in this paper.

Original languageEnglish (US)
Pages (from-to)4440-4442
Number of pages3
JournalIEEE Transactions on Magnetics
Volume30
Issue number6
DOIs
StatePublished - Nov 1994

Fingerprint

Magnetic anisotropy
Multilayer films
Anisotropy
Optical properties
Buffer layers
optical properties
Thin films
anisotropy
thin films
Coercive force
buffers
Magnetization
Temperature
figure of merit
coercivity
magnetization
room temperature
temperature

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Anisotropy and magneto-optical properties of sputtered Co/Ni multilayer thin films. / Zhang, Y. B.; Woollam, J. A.; Shen, J. X.; Sellmyer, D. J.

In: IEEE Transactions on Magnetics, Vol. 30, No. 6, 11.1994, p. 4440-4442.

Research output: Contribution to journalArticle

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