We have adapted variable angle spectroscopic ellipsometry (VASE) to the measurement of magneto-optic effects, specifically, the polar Kerr effect. The complete dielectric function tensor, including complex diagonal and off-diagonal elements, can be measured on one instrument. The index of refraction, extinction coefficient, Kerr rotation (p- and s-plane), and Kerr ellipticity (p- and s-plane) can be extracted from the same data. Equations for the analysis of raw ellipsometric data are given, and representative data for the Dy/Co multilayer system are presented.
|Original language||English (US)|
|Number of pages||8|
|Journal||Applied physics communications|
|Publication status||Published - Dec 1 1988|
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