Analysis of variable angle spectroscopic ellipsometric measurements on uncoated magneto-optic materials

William A. McGahan, Z. S. Shan, John A. Woollam

Research output: Contribution to journalArticle

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Abstract

We have adapted variable angle spectroscopic ellipsometry (VASE) to the measurement of magneto-optic effects, specifically, the polar Kerr effect. The complete dielectric function tensor, including complex diagonal and off-diagonal elements, can be measured on one instrument. The index of refraction, extinction coefficient, Kerr rotation (p- and s-plane), and Kerr ellipticity (p- and s-plane) can be extracted from the same data. Equations for the analysis of raw ellipsometric data are given, and representative data for the Dy/Co multilayer system are presented.

Original languageEnglish (US)
Pages (from-to)209-216
Number of pages8
JournalApplied physics communications
Volume8
Issue number4
Publication statusPublished - Dec 1 1988

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ASJC Scopus subject areas

  • Engineering(all)

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