An empirical field study of the yield shift theory of satisfaction

Robert O. Briggs, Bruce A. Reinig, G. J. De Vreede

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Stakeholders who experience dissatisfaction with a system, even for reasons unrelated to its technology, may decline to adopt it or may abandon it even if there is clear evidence of substantial benefit from its continued use. Yield Shift Theory (YST) proposes a causal explanation for the onset, magnitude, and direction of satisfaction responses. This study of 282 professional knowledge workers in the field doing technology-supported work on real problems finds that the satisfaction responses of the knowledge workers are consistent with the relationships proposed by YST. The relationships held for both causal constructs of YST: shifts-in-utility and shifts-in-likelihood of goal attainment. The relationships held for two objects-of-satisfaction: work processes and work outcomes.

Original languageEnglish (US)
Title of host publicationProceedings of the 47th Annual Hawaii International Conference on System Sciences, HICSS 2014
PublisherIEEE Computer Society
Pages492-499
Number of pages8
ISBN (Print)9781479925049
DOIs
StatePublished - Jan 1 2014
Event47th Hawaii International Conference on System Sciences, HICSS 2014 - Waikoloa, HI, United States
Duration: Jan 6 2014Jan 9 2014

Publication series

NameProceedings of the Annual Hawaii International Conference on System Sciences
ISSN (Print)1530-1605

Conference

Conference47th Hawaii International Conference on System Sciences, HICSS 2014
CountryUnited States
CityWaikoloa, HI
Period1/6/141/9/14

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Briggs, R. O., Reinig, B. A., & De Vreede, G. J. (2014). An empirical field study of the yield shift theory of satisfaction. In Proceedings of the 47th Annual Hawaii International Conference on System Sciences, HICSS 2014 (pp. 492-499). [6758665] (Proceedings of the Annual Hawaii International Conference on System Sciences). IEEE Computer Society. https://doi.org/10.1109/HICSS.2014.69