Advances in digital topography for characterizing imperfections in protein crystals

Jeffrey J. Lovelace, Cameron R. Murphy, Henry D. Bellamy, Keith Brister, Reinhard Pahl, Gloria E Borgstahl

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

A system which joins digital topography with fine φ-sliced reflection profiling has been developed and applied to cryocrystallography. In this demonstration, fifteen fine φ-sliced reflection profiles with corresponding topographic sequences are evaluated: twelve reflections from a crystal at cryogenic temperatures and three reflections from a room-temperature crystal. The digitally collected data show results comparable with film, albeit at a lower resolution, but are acquired at a substantially higher rate. Additionally, anti-blooming circuitry in the CCD was tested and shown to provide useful data even when pixels were overloaded.

Original languageEnglish (US)
Pages (from-to)512-519
Number of pages8
JournalJournal of Applied Crystallography
Volume38
Issue number3
DOIs
StatePublished - Jun 1 2005

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Topography
topography
proteins
Defects
Crystals
Temperature
defects
crystals
Proteins
cryogenic temperature
Charge coupled devices
Cryogenics
charge coupled devices
Demonstrations
Pixels
pixels
room temperature
profiles

ASJC Scopus subject areas

  • Biochemistry, Genetics and Molecular Biology(all)

Cite this

Advances in digital topography for characterizing imperfections in protein crystals. / Lovelace, Jeffrey J.; Murphy, Cameron R.; Bellamy, Henry D.; Brister, Keith; Pahl, Reinhard; Borgstahl, Gloria E.

In: Journal of Applied Crystallography, Vol. 38, No. 3, 01.06.2005, p. 512-519.

Research output: Contribution to journalArticle

Lovelace, Jeffrey J. ; Murphy, Cameron R. ; Bellamy, Henry D. ; Brister, Keith ; Pahl, Reinhard ; Borgstahl, Gloria E. / Advances in digital topography for characterizing imperfections in protein crystals. In: Journal of Applied Crystallography. 2005 ; Vol. 38, No. 3. pp. 512-519.
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