• 2342 Citations
  • 26 h-Index
1993 …2019
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Fingerprint Fingerprint is based on mining the text of the experts' scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

ultrasonics Physics & Astronomy
Ultrasonics Engineering & Materials Science
scattering Physics & Astronomy
attenuation Physics & Astronomy
Resonators Engineering & Materials Science
microscopes Physics & Astronomy
Stiffness Engineering & Materials Science
polycrystals Physics & Astronomy

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Research Output 1993 2019

  • 2342 Citations
  • 26 h-Index
  • 112 Article
  • 32 Conference contribution
  • 2 Chapter
Concrete mixtures
Geopolymers
Ointments
Hydrates
Energy dispersive spectroscopy
3 Citations

An integrated microstructural-nanomechanical-chemical approach to examine material-specific characteristics of cementitious interphase regions

Khedmati, M., Kim, Y. R., Turner, J. A., Alanazi, H. & Nguyen, C., Apr 1 2018, In : Materials Characterization. 138, p. 154-164 11 p.

Research output: Contribution to journalArticle

Ointments
Coal Ash
Geopolymers
fly ash
Adhesive pastes
1 Citations

Dielectric and piezoelectric performance of gadolinium-doped lead lanthanum zirconate titanate

Mansour, S., Eid, A., Abd El-Latif, L., Rashad, M., Afifi, M. & Turner, J., May 1 2018, In : International Journal of Applied Ceramic Technology. 15, 3, p. 766-774 9 p.

Research output: Contribution to journalArticle

Lanthanum
Ultrasonic transducers
Gadolinium
Dielectric losses
Curie temperature

Enhanced Ultrasonic Flaw Detection using an Ultra-high Gain and Time-dependent Threshold

Song, Y., Turner, J. A., Peng, Z., Chao, C. & Li, X., Apr 17 2018, (Accepted/In press) In : IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control.

Research output: Contribution to journalArticle

ultrasonic flaw detection
high gain
Ultrasonics
Defects
thresholds

Focused electron-beam-induced deposition for fabrication of highly durable and sensitive metallic AFM-IR probes

Qian, W., Sun, S., Song, J., Nguyen, C., Ducharme, S. & Turner, J. A., Jun 8 2018, In : Nanotechnology. 29, 33, 335702.

Research output: Contribution to journalArticle

Electron beams
Infrared radiation
Fabrication
Tungsten
Infrared imaging